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ASTM-E1426:2009 Edition

ASTM-E1426:2009 Edition

$40.63

E1426-98(2009)e1 Standard Test Method for Determining the Effective Elastic Parameter for X-Ray Diffraction Measurements of Residual Stress

Published By Publication Date Number of Pages
ASTM 2009 5
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1.1 This test method covers a procedure for experimentally determining the effective elastic parameter, E eff , for the evaluation of residual and applied stresses by X-ray diffraction techniques. The effective elastic parameter relates macroscopic stress to the strain measured in a particular crystallographic direction in polycrystalline samples. E eff should not be confused with E , the modulus of elasticity. Rather, it is nominally equivalent to E /(1 + ? ) for the particular crystallographic direction, where ? is Poisson’s ratio. The effective elastic parameter is influenced by elastic anisotropy and preferred orientation of the sample material.

1.2 This test method is applicable to all X-ray diffraction instruments intended for measurements of macroscopic residual stress that use measurements of the positions of the diffraction peaks in the high back-reflection region to determine changes in lattice spacing.

1.3 This test method is applicable to all X-ray diffraction techniques for residual stress measurement, including single, double, and multiple exposure techniques.

1.4 The values stated in inch-pound units are to be regarded as standard. The values given in parentheses are mathematical conversions to SI units that are provided for information only and are not considered standard.

1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

PDF Catalog

PDF Pages PDF Title
1 Scope
Referenced Documents
Terminology
2 Summary of Test Method
Significance and Use
Apparatus
Test Specimens
3 Calibration
Procedure
Calculation
FIG. 1
FIG. 2
4 Precision and Bias
Keywords

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