{"id":243811,"date":"2024-10-19T16:00:27","date_gmt":"2024-10-19T16:00:27","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-en-625672013\/"},"modified":"2024-10-25T10:57:44","modified_gmt":"2024-10-25T10:57:44","slug":"bs-en-625672013","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-en-625672013\/","title":{"rendered":"BS EN 62567:2013"},"content":{"rendered":"
IEC 62567:2013 provides test procedures based on the documents mentioned in the introduction and devoted to minimize the causes of discrepancy between test results, taking into consideration the large experience accumulated in the last 30 years by numerous test engineers and available in literature, including a CIGRE Technical Brochure specifically referring to this standard (see Bibliography). This Standard describes the current methodologies, including apparatus, procedures and accuracies, for the measurement of conductor self-damping and for the data reduction formats. In addition, some basic guidance is also provided to inform the potential user of a given method’s strengths and weaknesses. The methodologies and procedures incorporated in this Standard are applicable only to testing on indoor laboratory spans. Key words: Overhead lines, Self-damping, Conductors<\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
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6<\/td>\n | English CONTENTS <\/td>\n<\/tr>\n | ||||||
8<\/td>\n | INTRODUCTION <\/td>\n<\/tr>\n | ||||||
9<\/td>\n | 1 Scope 2 Normative references 3 Terms and definitions <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | 4 Symbols and units 5 Test span arrangements 5.1 General <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | 5.2 Span terminations Figures Figure 1 \u2013 Test span for conductor self-damping measurements <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | 5.3 Shaker and vibration control system Figure 2 \u2013 Rigid clamp <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | Figure 3 \u2013 Electro-dynamic shaker <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | 5.4 Location of the shaker 5.5 Connection between the shaker and the conductor under test 5.5.1 General Figure 4 \u2013 Layout of a test stand for conductor self-damping measurements <\/td>\n<\/tr>\n | ||||||
15<\/td>\n | 5.5.2 Rigid connection Figure 5 \u2013 Example of rigid connection <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | 5.5.3 Flexible connection 5.6 Transducers and measuring devices 5.6.1 Type of transducers Figure 6 \u2013 Example of flexible connection <\/td>\n<\/tr>\n | ||||||
17<\/td>\n | 5.6.2 Transducer accuracy Figure 7 \u2013 Miniature accelerometer <\/td>\n<\/tr>\n | ||||||
18<\/td>\n | 6 Conductor conditioning 6.1 General 6.2 Clamping 6.3 Creep 6.4 Running-in 7 Extraneous loss sources <\/td>\n<\/tr>\n | ||||||
19<\/td>\n | 8 Test procedures 8.1 Determination of span resonance <\/td>\n<\/tr>\n | ||||||
20<\/td>\n | 8.2 Power Method Figure 8 \u2013 Resonant condition detected by the acceleration and force signals <\/td>\n<\/tr>\n | ||||||
22<\/td>\n | 8.3 ISWR Method <\/td>\n<\/tr>\n | ||||||
24<\/td>\n | 8.4 Decay method <\/td>\n<\/tr>\n | ||||||
25<\/td>\n | Figure 9 \u2013 Fuse wire system disconnecting a shaker from a test span; this double exposure shows the mechanism both closed and open. <\/td>\n<\/tr>\n | ||||||
26<\/td>\n | 8.5 Comparison between the test methods Figure 10 \u2013 A decay trace <\/td>\n<\/tr>\n | ||||||
27<\/td>\n | 8.6 Data presentation Tables Table 1 \u2013 Comparison of laboratory methods <\/td>\n<\/tr>\n | ||||||
28<\/td>\n | Table 2 \u2013 Comparison of Conductor Self-damping Empirical Parameters <\/td>\n<\/tr>\n | ||||||
29<\/td>\n | Annex A (normative) Recommended test parameters <\/td>\n<\/tr>\n | ||||||
30<\/td>\n | Annex B (informative) Reporting recommendations <\/td>\n<\/tr>\n | ||||||
31<\/td>\n | Figure B.1 \u2013 Example of conductor power dissipation characteristics <\/td>\n<\/tr>\n | ||||||
32<\/td>\n | Figure B.2 \u2013 Example of conductor power dissipation characteristics <\/td>\n<\/tr>\n | ||||||
33<\/td>\n | Annex C (informative) Correction for aerodynamic damping <\/td>\n<\/tr>\n | ||||||
34<\/td>\n | Table C.1 \u2013 Coefficients to be used with equation C-3 <\/td>\n<\/tr>\n | ||||||
35<\/td>\n | Annex D (informative) Correction of phase shift between transducers <\/td>\n<\/tr>\n | ||||||
36<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Overhead lines. Methods for testing self-damping characteristics of conductors<\/b><\/p>\n |