{"id":416995,"date":"2024-10-20T06:13:47","date_gmt":"2024-10-20T06:13:47","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-en-60749-292011-2\/"},"modified":"2024-10-26T11:34:51","modified_gmt":"2024-10-26T11:34:51","slug":"bs-en-60749-292011-2","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-en-60749-292011-2\/","title":{"rendered":"BS EN 60749-29:2011"},"content":{"rendered":"

This part of IEC 60749 covers the I-test and the overvoltage latch-up testing of integrated circuits.<\/p>\n

This test is classified as destructive.<\/p>\n

The purpose of this test is to establish a method for determining integrated circuit (IC) latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing “no trouble found” (NTF) and “electrical overstress” (EOS) failures due to latch-up.<\/p>\n

This test method is primarily applicable to CMOS devices. Applicability to other technologies must be established.<\/p>\n

The classification of latch-up as a function of temperature is defined in 3.1 and the failure level criteria are defined in 3.2<\/p>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
5<\/td>\nEnglish
\n
CONTENTS <\/td>\n<\/tr>\n
6<\/td>\n1 Scope and object
2 Terms and definitions <\/td>\n<\/tr>\n
9<\/td>\n3 Classification and levels
3.1 Classification
3.2 Levels
4 Apparatus and material
4.1 Latch-up tester <\/td>\n<\/tr>\n
10<\/td>\nFigures
\n
Figure 1 \u2013 Vsupply qualification circuit <\/td>\n<\/tr>\n
12<\/td>\nFigure 3 \u2013 Latch-up test flow <\/td>\n<\/tr>\n
13<\/td>\nTables
\n
Table 1 \u2013 Test matrixa <\/td>\n<\/tr>\n
14<\/td>\n5.2 Detailed latch-up test procedure
Table 2 \u2013 Timing specifications for I-test and Vsupply overvoltage test <\/td>\n<\/tr>\n
21<\/td>\n6 Failure criteria
7 Summary <\/td>\n<\/tr>\n
22<\/td>\nAnnex A (informative)
\nExamples of special pins that are connectedto passive components <\/td>\n<\/tr>\n
23<\/td>\nFigure A.1 \u2013 Examples of special pins that are connected to passive components <\/td>\n<\/tr>\n
24<\/td>\nAnnex B (informative) Calculation of operating ambient or operating case temperature
\nfor a given operating junction temperature <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Semiconductor devices. Mechanical and climatic test methods – Latch-up test<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
BSI<\/b><\/a><\/td>\n2011<\/td>\n26<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":417004,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[573,2641],"product_tag":[],"class_list":{"0":"post-416995","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-31-080-01","7":"product_cat-bsi","9":"first","10":"instock","11":"sold-individually","12":"shipping-taxable","13":"purchasable","14":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/416995","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/417004"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=416995"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=416995"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=416995"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}