{"id":462698,"date":"2024-10-20T10:23:41","date_gmt":"2024-10-20T10:23:41","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-en-iso-21068-42024\/"},"modified":"2024-10-26T19:16:47","modified_gmt":"2024-10-26T19:16:47","slug":"bs-en-iso-21068-42024","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-en-iso-21068-42024\/","title":{"rendered":"BS EN ISO 21068-4:2024"},"content":{"rendered":"
This document describes methods for the determination of mineralogical phases typically apparent in nitride and oxy-nitride bonded silicon carbide refractory products using a Bragg-Brentano diffractometer. It includes details of sample preparations and general principles for qualitative and quantitative analyses of mineralogical phase composition. Quantitative determination of ?-Si3N4, ?-Si3N4, Si2ON2, AlN, and ?\u2019- SiAlON are described. For quantitative determination of ?-Si3N4, ?-Si3N4, Si2ON2, AlN and ?\u2019- SiAlON refinement procedures based on the total nitrogen content of the sample are described. NOTE ISO 21068-3 is used for the analysis of the total nitrogen content of the sample.<\/p>\n
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2<\/td>\n | undefined <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | 6.1 Sample preparation 6.2 Measuring parameters <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | 6.3 Qualitative analysis 6.4 Quantitative analysis 6.4.1 General <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | 6.4.2 Calculation <\/td>\n<\/tr>\n | ||||||
15<\/td>\n | 7.1 Repeatability 7.2 Reproducibility <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Chemical analysis of raw materials and refractory products containing silicon-carbide, silicon-nitride, silicon-oxynitride and sialon – XRD methods<\/b><\/p>\n |