BS IEC 60748-23-2:2002

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Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification – Internal visual inspection and special tests

Published By	Publication Date	Number of Pages
BSI	2002	100

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Description

Applies to high quality approval systems for hybrid integrated circuits and film structures. The purpose of the tests is to perform visual inspections on the internal materials, construction and workmanship of hybrid, multichip and multichip module microcircuits and passive elements used for microelectronic applications including r.f./microwave. These tests will normally be used on microelectronic devices prior to capping or encapsulation to detect and eliminate devices with internal non-conformances that could lead to device failure in normal application. They may also be employed on a sampling basis to determine the effectiveness of the manufacturers’ quality control and handling procedures.

Additional information

Status	Definitive
Pages	100
Publication Date	2002-06-21
ISBN	0 580 39866 8
Standard Number	BS IEC 60748-23-2:2002
Title	Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification – Internal visual inspection and special tests
Identical National Standard Of	IEC 60748-23-2:2002
Descriptors	Internal, Hybrid integrated circuits, Electrical testing, Visual inspection (testing), Semiconductor devices, Electrical equipment, Electrical components, Integrated film circuits, Integrated circuits, Electronic equipment and components
Publisher	BSI
Committee	EPL/47
ICS Codes	31.200 - Integrated circuits. Microelectronics

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BS IEC 60748-23-2:2002

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