BS ISO 15470:2017
$102.76
Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
Published By | Publication Date | Number of Pages |
BSI | 2017 | 16 |
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PDF Catalog
PDF Pages | PDF Title |
---|---|
6 | Foreword |
7 | Introduction |
9 | 1 Scope 2 Normative references 3 Terms and definitions 4 Abbreviated terms 5 Description of selected instrumental performance parameters 5.1 Method of analysis 5.2 Samples |
10 | 5.3 System configuration 5.4 X-ray source 5.4.1 Anode type 5.4.2 Anode power 5.4.3 Expected anode lifetime 5.5 Spectrometer intensity performance and energy resolution 5.6 Spectrometer energy scale |
11 | 5.7 Spectrometer intensity linearity 5.8 Spectrometer response function 5.9 Imaging and selected area resolution 5.9.1 General 5.9.2 Method 1 5.9.3 Method 2 |
12 | 5.9.4 Method 3 5.10 Charge neutralization 5.11 Angle-resolved XPS 5.12 Vacuum environment |
13 | Bibliography |
Status | Confirmed |
---|---|
Pages | 16 |
Publication Date | 2017-03-31 |
ISBN | 978 0 580 95233 3 |
Standard Number | BS ISO 15470:2017 |
Title | Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters |
Identical National Standard Of | ISO 15470:2017 |
Replaces | BS ISO 15470:2004 |
Descriptors | Electron emission, Test equipment, Photoelectron spectroscopy, Chemical analysis and testing, Surface chemistry, Spectroscopy, X-ray photoelectron spectroscopy, Instrumental methods of analysis, Surfaces, Properties |
Publisher | BSI |
Committee | CII/60 |
ICS Codes | 71.040.40 - Chemical analysis |
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