ASTM-E327 1994
$35.75
E327-94 Test Method for Optical Emission Spectrometric Analysis of Stainless Type 18-8 Steels by the Point-To-Plane Technique (Withdrawn 1999)
Published By | Publication Date | Number of Pages |
ASTM | 1994 | 5 |
ASTM E327-94
Withdrawn Standard: Test Method for Optical Emission Spectrometric Analysis of Stainless Type 18-8 Steels by the Point-To-Plane Technique (Withdrawn 1999)
ASTM E327
Scope
1.1 This test method covers the optical emission spectrometric analysis of stainless Type 18-8 steels for the following elements:
Element Concentration Range, % Chromium 17.0 to 20.0 Nickel 8.0 to 15.0 Manganese 0.8 to 2.0 Silicon 0.4 to 0.8 Copper 0.1 to 0.2
1.2 This test method is designed for routine analysis of chill-cast disks or inspection testing of stainless Type 18-8 steel flats upon which a surface of at least 13-mm (1/2-in.) diameter may be prepared. The samples must be sufficiently massive to prevent overheating during the discharge and of similar metallurgical condition and composition as the standards used.
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
Keywords
Chromium content-ferrous alloys; Copper content-ferrous alloys; Manganese content-ferrous alloys; Nickel content-metals/alloys; Optical emission spectrometric analysis; Point-to-point technique; Silicon content-ferrous alloys; Spectrochemical analysis-optical emission; Spectrometry-optical emission; Stainless steel; Steel-spectrochemical analysis; stainless steel (type 18-8)-optical emission spectrometric analysis, by; point-to-plane technique, test
ICS Code
ICS Number Code 77.140.20 (Steels of high quality)
DOI: 10.1520/E0327-94
PDF Catalog
PDF Pages | PDF Title |
---|---|
1 | Scope Referenced Documents Terminology Summary of Test Method Apparatus |
2 | Reagents and Materials Standards Preparation of Samples and Secondary Standards Preparation of Apparatus TABLE 1 TABLE 2 |
3 | Calibration, Standardization, and Verification TABLE 3 |
4 | Excitation and Radiation Measurements Calculation Precision and Bias TABLE 4 |
5 | Keywords |