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ASTM-E82 2007

$44.96

E82-91(2007) Standard Test Method for Determining the Orientation of a Metal Crystal

Published By Publication Date Number of Pages
ASTM 2007 13
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1.1 This test method covers the back-reflection Laue procedure for determining the orientation of a metal crystal. The back-reflection Laue method for determining crystal orientation (1, 2) may be applied to macrograins (3) (0.5-mm diameter or larger) within polycrystalline aggregates, as well as to single crystals of any size. The method is described with reference to cubic crystals; it can be applied equally well to hexagonal, tetragonal, or orthorhombic crystals.

1.2 Most natural crystals have well developed external faces, and the orientation of such crystals can usually be determined from inspection. The orientation of a crystal having poorly developed faces, or no faces at all (for example, a metal crystal prepared in the laboratory) must be determined by more elaborate methods. The most convenient and accurate of these involves the use of X-ray diffraction. The ‘orientation of a metal crystal’ is known when the positions in space of the crystallographic axes of the unit cell have been located with reference to the surface geometry of the crystal specimen. This relation between unit cell position and surface geometry is most conveniently expressed by stereographic or gnomonic projection.

1.3 The values stated in inch-pound units are to be regarded as the standard.

1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

PDF Catalog

PDF Pages PDF Title
1 Scope
Referenced Documents
Summary of Test Method
Significance and Use
Apparatus
2 Test Specimen
Orientation of Specimen and Film
Back-Reflection Laue Pattern
FIG. 1
FIG. 2
3 Hyperbolic and Polar Coordinate Charts
FIG. 3
4 Interpretation of Unsymmetrical Back-Reflection Laue Patterns
FIG. 4
5 FIG. 5
6 FIG. 6
FIG. 7
7 Precision and Bias
Keywords
FIG. 8
8 FIG. 9
9 TABLE 1
10 FIG. 10
11 FIG. 11
12 FIG. 12
FIG. 13
13 REFERENCES
ASTM-E82 2007
$44.96