ASTM-F18:2012 Edition
$40.63
F18-12 Standard Specification and Test Method for Evaluation of Glass-to-Metal Headers Used in Electron Devices
Published By | Publication Date | Number of Pages |
ASTM | 2012 | 5 |
ASTM F18-12
Historical Standard: Standard Specification and Test Method for Evaluation of Glass-to-Metal Headers Used in Electron Devices
ASTM F18
Scope
1.1 This specification and test method cover acceptance requirements for headers used in electron devices and describes procedures for determining conformance to these requirements.
1.2 The values stated in inch-pound units are to be regarded as standard. The values given in parentheses are mathematical conversions to SI units that are provided for information only and are not considered standard.
1.3 The following safety hazard caveat pertains only to the test method (Sections 7-13) described in this specification. This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
Keywords
electrical testing; glass to metal sealing; mechanical test methods ; Electronic materials/applications; Electronic materials/applications–specifications; Electron tubes; Glass electrical/electronic insulation; Glass-to-metal sealing applications; Headers (glass-to-metal); Mechanical analysis/testing; Metal electronic components/devices; Metal electronic components/devices–specifications; Thermal shock materials/testing; Transformations
ICS Code
ICS Number Code 31.240 (Mechanical structures for electronic equipment)
DOI: 10.1520/F0018-12
PDF Catalog
PDF Pages | PDF Title |
---|---|
1 | Scope Terminology Significance and Use Acceptance Requirements Apparatus |
2 | Conditions of Test Thermal Shock Torque Lead Fatigue FIG. 1 |
3 | Electrical Leakage Simulated Thermal Welding Shock Transformation FIG. 2 FIG. 3 |
4 | Pull Test FIG. 4 FIG. 5 |
5 | Report Precision and Bias Keywords |