ASTM-F676 1997

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F676-97 Standard Test Method for Measuring Unsaturated TTL Sink Current

Published By	Publication Date	Number of Pages
ASTM	1997	4

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Categories: 31.080.30 - Transistors, ASTM

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Description

ASTM F676-97

Historical Standard: Standard Test Method for Measuring Unsaturated TTL Sink Current

ASTM F676

Scope

1.1 This test method covers the measurement of the unsaturated sink current of transistor-transistor logic (TTL) devices under specified conditions.

1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Keywords

hardness assurance; neutron degradation; sink current; transistor-transistor logic (TTL)

ICS Code

ICS Number Code 31.080.30 (Transistors)

DOI: 10.1520/F0676-97

Additional information

Standard Title	F676-97 Standard Test Method for Measuring Unsaturated TTL Sink Current
Published Code	ASTM
Publication Date	1997
Pages Count	4
ICS Codes	31.080.30 - Transistors

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ASTM-F676 1997

ASTM F676-97

Historical Standard: Standard Test Method for Measuring Unsaturated TTL Sink Current

ASTM F676

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