| Descriptors |
Multiple, Quality control, Semiconductor devices, Junction diodes, Optical measurement, Leak tests, Flammability, Infrared radiation, Fire tests, Defects, Luminous intensity, Detail specification, Light emission, Quality assurance systems, Luminance, Capability approval, Illuminance, Statistical quality control, Solderability testing, Light-emitting devices, Test equipment, Inspection, Testing conditions, Sampling methods, Optoelectronic devices, Assessed quality, High-temperature testing, Light-emitting diodes, Approval testing, Environmental testing, Technical documents, Specification (approval), Diodes, Visual inspection (testing), Bend testing, Electronic equipment and components, Acceptance (approval), Thermal-cycling tests, Semiconductor diodes, Marking
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