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BS EN 12698-2:2007

BS EN 12698-2:2007

$102.76

Chemical analysis of nitride bonded silicon carbide refractories – XRD methods

Published By Publication Date Number of Pages
BSI 2007 16
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This standard describes methods for the determination of mineralogical phases typically apparent in nitride and oxy-nitride bonded silicon carbide refractory products using a Bragg-Brentano diffractometer. It includes details of sample preparation and general principles for qualitative and quantitative analysis of mineralogical phase composition. Quantitative determination of ?-Si3N4, ?-Si3N4, Si2ON2, AlN, and SiAlON are described. NOTE For the refinement procedures the total nitrogen content, analysed in accordance with EN 12698-1 is needed.

BS EN 12698-2:2007
$102.76