BS EN 60749-29:2003 2004

$142.49

Semiconductor devices. Mechanical and climatic test methods – Latch-up test

Published By	Publication Date	Number of Pages
BSI	2004	24

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Categories: 31.080.01 - Semiconductor devices in general, BSI

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Description

Covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is to establish a method for determining integrated circuit latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing “No Trouble Found” and “Electrical Overstress” failures due to latch-up.

Additional information

Status	Withdrawn
Title	Semiconductor devices. Mechanical and climatic test methods – Latch-up test
Corrects	BS EN 60749-29:2003
Publisher	BSI
Committee	EPL/47
Pages	24
Publication Date	2004-06-29
Withdrawn Date	2011-08-31
Replaced By	BS EN 60749-29:2011
ISBN	0 580 43523 7
Standard Number	BS EN 60749-29:2003
Identical National Standard Of	IEC 60749-29:2003, EN 60749-29 (IEC 60749-29:2003) AS, EN 61334-6:2000
Descriptors	Failure rate, Climate, Overvoltage tests, Semiconductor devices, Destructive testing, Electrical impedance, Electrical faults, Environmental testing, Overvoltage, Electrical testing, Mechanical testing, Integrated circuits, Electronic equipment and components
ICS Codes	31.080.01 - Semiconductor devices in general

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BS EN 60749-29:2003 2004

$142.49


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