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BS EN 61010-031:2015+A1:2021:2022 Edition

BS EN 61010-031:2015+A1:2021:2022 Edition

$215.11

Safety requirements for electrical equipment for measurement, control and laboratory use – Safety requirements for hand-held and hand-manipulated probe assemblies for electrical test and measurement

Published By Publication Date Number of Pages
BSI 2022 98
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PDF Catalog

PDF Pages PDF Title
2 undefined
4 European foreword
Endorsement notice
9 Final version
10 English
CONTENTS
15 FOREWORD
18 1 Scope and object
1.1 Scope
1.1.1 Probe assemblies included in scope
19 Figures
Figure 1 ā€“ Examples of type A probe assemblies
Figure 2 ā€“ Examples of type B probe assemblies
20 Figure 3 ā€“ Examples of type C probe assemblies
Figure 4 ā€“ Examples of type D probe assemblies
21 1.1.2 Probe assemblies excluded from scope
1.2 Object
1.2.1 Aspects included in scope
1.2.2 Aspects excluded from scope
1.3 Verification
1.4 Environmental conditions
1.4.1 Normal environmental conditions
1.4.2 Extended environmental conditions
22 2 Normative references
3 Terms and definitions
3.1 Parts and accessories
23 3.2 Quantities
Figure 5 ā€“ Example of a stackable connector with a male connector and a female terminal
24 3.3 Tests
3.4 Safety terms
25 3.5 Insulation
26 4 Tests
4.1 General
27 4.2 Sequence of tests
4.3 Reference test conditions
4.3.1 Environmental conditions
4.3.2 State of probe assemblies
4.3.3 Position of the probe assembly
28 4.3.4 Accessories
4.3.5 Covers and removable parts
4.3.6 Input and output voltages
4.3.7 Controls
4.3.8 Connections
4.3.9 Short-term or intermittent operation
4.4 Testing in single fault condition
4.4.1 General
4.4.2 Application of fault conditions
29 4.4.3 Duration of tests
4.4.4 Conformity after application of fault conditions
30 4.5 Tests in reasonably foreseeable misuse
4.5.1 General
4.5.2 Fuses
5 Marking and documentation
5.1 Marking
5.1.1 General
31 5.1.2 Identification
5.1.3 Fuses
Tables
Table 1 ā€“ Symbols
32 5.1.4 Connectors and operating devices
5.1.5 Rating
5.2 Warning markings
5.3 Durability of markings
33 5.4 Documentation
5.4.1 General
5.4.2 Probe assembly rating
5.4.3 Probe assembly operation
34 5.4.4 Probe assembly maintenance and service
6 Protection against electric shock
6.1 General
35 6.2 Determination of accessible parts
6.2.1 General
6.2.2 Examination
36 6.2.3 Openings for pre-set controls
6.3 Limit values for accessible parts
6.3.1 General
Figure 6 ā€“ Methods for determination of accessible parts (see 6.2)and for voltage tests of (see 6.4.2)
37 6.3.2 Levels in normal condition
6.3.3 Levels in single fault condition
38 Figure 7 ā€“ Capacitance level versus voltage in normal condition and single-fault condition (see 6.3.2 c) and 6.3.3 c))
39 6.3.4 Measurement of voltage and touch current
Figure 8 ā€“ Voltage and touch current measurement
40 Figure 9 ā€“ Voltage and touch current measurement for the reference connector
41 Figure 10 ā€“ Voltage and touch current measurement with shielded test probe
42 6.4 Means of protection against electric shock
6.4.1 General
Figure 11 ā€“ Maximum test probe input voltage for 70 mA touch current
43 6.4.2 Connectors
44 6.4.3 Probe tips
Table 2 ā€“ Spacings for unmated connectors rated up to 1 000 V a.c. or 1 500 V d.c. with hazardous live conductive parts
45 Figure 12 ā€“ Protection by a protective fingerguard
Figure 13 ā€“ Protection by distance
46 6.4.4 Impedance
6.4.5 Protective impedance
Figure 14 ā€“ Protection by tactile indicator
47 6.4.6 Basic insulation, supplementary insulation, double insulation and reinforced insulation
6.5 Insulation requirements
6.5.1 The nature of insulation
48 Table 3 ā€“ Multiplication factors for clearances of probe assembly ratedfor operation at altitudes up to 5 000 m
50 Table 6 ā€“ Clearances of probe assemblies rated for measurement categories
51 Table 7 ā€“ Clearance values for the calculation of 6.5.2.3.2
52 Figure 18 ā€“ Example of recurring peak voltage
53 Table 8 ā€“ Clearances for basic insulation in probe assemblies subjected to recurring peak voltages or working voltages with frequencies above 30 kHz
54 Table 9 ā€“ Creepage distances for basic insulation or supplementary insulation
55 Table 4 ā€“ a.c. test voltages for testing electric strength of solid insulation in probe assemblies rated for measurement categories
56 Table 14 ā€“ Impulse test voltages for testing electric strength of solid insulation in probe assemblies rated for measurement categories
57 Figure 15 ā€“ Distance between conductors on an interface between two layers
Figure 16 ā€“ Distance between adjacent conductors along an interface of two layers
58 Table 5 ā€“ Minimum values for distance or thickness
59 Figure 17 ā€“ Distance between adjacent conductors located between the same two layers
60 6.6 Procedure for voltage tests
6.6.2 Humidity preconditioning
61 6.6.3 Conduct of tests
6.6.4 Test voltages
62 Table 10 ā€“ Test voltages based on clearances
63 6.6.5 Test procedures
Table 11 ā€“ Correction factors according to test site altitudefor test voltages for clearances
64 6.7 Constructional requirements for protection against electric shock
6.7.1 General
6.7.2 Insulating materials
6.7.3 Enclosures of probe assemblies with double insulation or reinforced insulation
6.7.4 Probe wire attachment
66 Figure 19 ā€“ Flexing test
67 Table 12 ā€“ Pull forces for probe wire attachment tests
68 7 Protection against mechanical hazards
8 Resistance to mechanical stresses
8.1 General
Figure 20 ā€“ Rotational flexing test
69 8.2 Rigidity test
8.3 Drop test
8.4 Impact swing test
70 9 Temperature limits and protection against the spread of fire
9.1 General
Figure 21 ā€“ Impact swing test
71 9.2 Temperature tests
10 Resistance to heat
10.1 Integrity of spacings
10.2 Resistance to heat
11 Protection against hazards from fluids
11.1 General
11.2 Cleaning
72 11.3 Specially protected probe assemblies
12 Components
12.1 General
12.2 Fuses
73 12.3 Probe wire
12.3.1 General
12.3.2 Rating of probe wire
12.3.3 Pressure test at high temperature for insulations
74 12.3.4 Tests for resistance of insulation to cracking
Figure 22 ā€“ Indentation device
75 12.3.5 Voltage test
Table 13 ā€“ Diameter of mandrel and numbers of turns
76 12.3.6 Tensile test
77 13 Prevention of hazard from arc flash and short-circuits
13.1 General
78 13.2 Exposed conductive parts
79 Annex A (normative) Measuring circuits for touch current (see 6.3)
Figure A.1 ā€“ Measuring circuit for a.c. with frequencies up to 1 MHz and for d.c.
80 Figure A.2 ā€“ Measuring circuits for a.c. with sinusoidal frequenciesup to 100 Hz and for d.c.
81 Figure A.3 ā€“ Current measuring circuit for electrical burns
Figure A.4 ā€“ Current measuring circuit for high frequency test probes
82 Figure A.5 ā€“ Current measuring circuit for wet locations
83 Annex B (normative) Standard test fingers
Figure B.1 ā€“ Rigid test finger
84 Figure B.2 ā€“ Jointed test finger
86 Annex C (normative) Measurement of clearances and creepage distances
Table C.1 ā€“ Dimension of X
88 Annex D (normative) Routine spark tests on probe wire
Table D.1 ā€“ Maximum centre-to-centre spacings of bead chains
89 Figure D.1 ā€“ Bead Chain Configuration (if applicable)
90 Table D.2 ā€“ Formula for maximum speed of wire in terms of electrode length L of link- or bead-chain electrode
92 Annex E (informative) 4 mm connectors
93 Figure E.1 ā€“ Recommended dimensions of 4 mm connectors
94 Annex F (normative) Measurement Categories
95 Figure F.1 ā€“ Example to identify the locations of measurement categories
Table F.1 ā€“ Characteristics of measurement categories
96 Annex G Index of defined terms
97 Bibliography

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BS EN 61010-031:2015+A1:2021
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