BS EN 61163-1:2006:2007 Edition

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Reliability stress screening – Repairable assemblies manufactured in lots

Published By	Publication Date	Number of Pages
BSI	2007	84

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Categories: 03.120.01 - Quality in general, BSI

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Description

This part of IEC 61163 describes particular methods to apply and optimize reliability stress screening processes for lots of repairable hardware assemblies, in cases where the assemblies have an unacceptably low reliability in the early failure period, and when other methods, such as reliability growth programmes and quality control techniques, are not applicable.

Additional information

Status	Definitive
Pages	84
Publication Date	2007-08-31
ISBN	978 0 580 54071 4
Standard Number	BS EN 61163-1:2006
Title	Reliability stress screening – Repairable assemblies manufactured in lots
Identical National Standard Of	EN 61163-1:2006, IEC 61163-1:2006
Replaces	BS 5760-16.1:1996
Descriptors	Production, Quality control, Statistical quality control, Product tests, Stress, Defects, Repair, Failure (quality control), Batch production, Performance
Publisher	BSI
Committee	DS/1
ICS Codes	03.120.01 - Quality in general

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BS EN 61163-1:2006:2007 Edition

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