BS EN 62386-103:2014:2015 Edition
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Digital addressable lighting interface – General requirements. Control devices
Published By | Publication Date | Number of Pages |
BSI | 2015 | 220 |
IEC 62386-103:2014 is applicable to control devices in a bus system for control by digital signals of electronic lighting equipment. This electronic lighting equipment should be in line with the requirments of IEC 61347, with the addition of d.c. supplies. This publication is to be read in conjunction with /2
PDF Catalog
PDF Pages | PDF Title |
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6 | English CONTENTS |
15 | INTRODUCTION Figures Figure 1 – IEC 62386 graphical overview |
17 | 1 Scope 2 Normative references 3 Terms and definitions |
20 | 4 General 4.1 General 4.2 Version number 5 Electrical specification 6 Interface power supply 7 Transmission protocol structure 7.1 General |
21 | 7.2 24 bit forward frame encoding 7.2.1 Frame format for instructions and queries Tables Table 1 – 24bit command frame encoding Table 2 – Instance byte in a command frame |
22 | 7.2.2 Frame format for event messages Table 3 – 24bit event message frame encoding |
23 | 8 Timing 9 Method of operation 9.1 General 9.2 Application controller 9.2.1 General |
24 | 9.2.2 Single-master application controller 9.2.3 Multi-master application controller 9.3 Input device |
25 | 9.4 Instances of input devices 9.4.1 General 9.4.2 Instance number 9.4.3 Instance type 9.4.4 Feature type Table 4 – Instance types Table 5 – Feature types |
26 | 9.4.5 Instance groups 9.5 Commands 9.5.1 General 9.5.2 Device commands Table 6 – Instance group variables |
27 | 9.5.3 Instance commands 9.5.4 Feature commands 9.6 Event messages 9.6.1 Response to event messages 9.6.2 Device power cycle event 9.6.3 Input notification event Table 7 – Device address information in power cycle event |
28 | 9.6.4 Event message filter Table 8 – Event addressing schemes |
29 | 9.7 Input signal and input value 9.7.1 General 9.7.2 Input resolution 9.7.3 Getting the input value Table 9 – Signal level (~50%) versus resolution and input value |
30 | 9.7.4 Notification of changes 9.8 System failure Table 10 – Example querying sequence to read a 4byte input value |
31 | 9.9 Operating a control device 9.9.1 Enable/disable the application controller 9.9.2 Enable/disable event messages 9.9.3 Quiescent mode |
32 | 9.9.4 Modes of operation 9.10 Memory banks 9.10.1 General |
33 | 9.10.2 Memory map 9.10.3 Selecting a memory bank location Table 11 – Basic memory map of memory banks |
34 | 9.10.4 Memory bank reading 9.10.5 Memory bank writing |
35 | 9.10.6 Memory bank 0 |
36 | Table 12 – Memory map of memory bank 0 |
37 | 9.10.7 Memory bank 1 |
38 | Table 13 – Memory map of memory bank 1 |
39 | 9.10.8 Manufacturer specific memory banks 9.10.9 Reserved memory banks 9.11 Reset 9.11.1 Reset operation 9.11.2 Reset memory bank operation 9.12 Power on behaviour 9.12.1 Power on |
40 | 9.12.2 Power cycle notification 9.13 Priority use 9.13.1 General 9.13.2 Priority of input notifications |
41 | 9.14 Assigning short addresses 9.14.1 General 9.14.2 Random address allocation 9.14.3 Identification of a device |
42 | 9.15 Exception handling 9.16 Device capabilities and status information 9.16.1 Device capabilities 9.16.2 Device status Table 14 – Control device capabilities Table 15 – Control device status |
43 | 9.16.3 Instance status 9.17 Non-volatile memory Table 16 – Instance status |
44 | 10 Declaration of variables Table 17 – Declaration of device variables |
45 | 11 Definition of commands 11.1 General 11.2 Overview sheets Table 18 – Declaration of instance variables Table 19 – Instance event messages Table 20 – Device event messages |
46 | Table 21 – Standard commands |
49 | Table 22 – Special commands (implemented by both application controller and input device) |
50 | 11.3 Event messages 11.3.1 INPUT NOTIFICATION (device/instance, event) 11.3.2 POWER NOTIFICATION (device) 11.4 Device control instructions 11.4.1 General 11.4.2 IDENTIFY DEVICE |
51 | 11.4.3 RESET POWER CYCLE SEEN 11.5 Device configuration instructions 11.5.1 General 11.5.2 RESET 11.5.3 RESET MEMORY BANK (DTR0) 11.5.4 SET SHORT ADDRESS (DTR0) 11.5.5 ENABLE WRITE MEMORY |
52 | 11.5.6 ENABLE APPLICATION CONTROLLER 11.5.7 DISABLE APPLICATION CONTROLLER 11.5.8 SET OPERATING MODE (DTR0) 11.5.9 ADD TO DEVICE GROUPS 0-15 (DTR2:DTR1) 11.5.10 ADD TO DEVICE GROUPS 16-31 ( DTR2:DTR1 ) 11.5.11 REMOVE FROM DEVICE GROUPS 0-15 (DTR2:DTR1) 11.5.12 REMOVE FROM DEVICE GROUPS 16-31 (DTR2:DTR1) 11.5.13 START QUIESCENT MODE 11.5.14 STOP QUIESCENT MODE |
53 | 11.5.15 ENABLE POWER CYCLE NOTIFICATION 11.5.16 DISABLE POWER CYCLE NOTIFICATION 11.5.17 SAVE PERSISTENT VARIABLES 11.6 Device queries 11.6.1 General 11.6.2 QUERY DEVICE CAPABILITIES 11.6.3 QUERY DEVICE STATUS |
54 | 11.6.4 QUERY APPLICATION CONTROLLER ERROR 11.6.5 QUERY INPUT DEVICE ERROR 11.6.6 QUERY MISSING SHORT ADDRESS 11.6.7 QUERY VERSION NUMBER 11.6.8 QUERY CONTENT DTR0 11.6.9 QUERY NUMBER OF INSTANCES 11.6.10 QUERY CONTENT DTR1 11.6.11 QUERY CONTENT DTR2 |
55 | 11.6.12 QUERY RANDOM ADDRESS (H) 11.6.13 QUERY RANDOM ADDRESS (M) 11.6.14 QUERY RANDOM ADDRESS (L) 11.6.15 READ MEMORY LOCATION (DTR1, DTR0) 11.6.16 QUERY APPLICATION CONTROL ENABLED 11.6.17 QUERY OPERATING MODE 11.6.18 QUERY MANUFACTURER SPECIFIC MODE 11.6.19 QUERY QUIESCENT MODE 11.6.20 QUERY DEVICE GROUPS 0-7 |
56 | 11.6.21 QUERY DEVICE GROUPS 8-15 11.6.22 QUERY DEVICE GROUPS 16-23 11.6.23 QUERY DEVICE GROUPS 24-31 11.6.24 QUERY POWER CYCLE NOTIFICATION 11.6.25 QUERY EXTENDED VERSION NUMBER(DTR0) 11.6.26 QUERY RESET STATE 11.7 Instance control instructions 11.8 Instance configuration instructions 11.8.1 General |
57 | 11.8.2 ENABLE INSTANCE 11.8.3 DISABLE INSTANCE 11.8.4 SET PRIMARY INSTANCE GROUP (DTR0) 11.8.5 SET INSTANCE GROUP 1 (DTR0) 11.8.6 SET INSTANCE GROUP 2 (DTR0) 11.8.7 SET EVENT SCHEME (DTR0) |
58 | 11.8.8 SET EVENT PRIORITY (DTR0) 11.8.9 SET EVENT FILTER (DTR2, DTR1, DTR0) 11.9 Instance queries 11.9.1 General 11.9.2 QUERY INSTANCE TYPE 11.9.3 QUERY RESOLUTION 11.9.4 QUERY INSTANCE ERROR 11.9.5 QUERY INSTANCE STATUS |
59 | 11.9.6 QUERY INSTANCE ENABLED 11.9.7 QUERY PRIMARY INSTANCE GROUP 11.9.8 QUERY INSTANCE GROUP 1 11.9.9 QUERY INSTANCE GROUP 2 11.9.10 QUERY EVENT SCHEME 11.9.11 QUERY INPUT VALUE 11.9.12 QUERY INPUT VALUE LATCH 11.9.13 QUERY EVENT PRIORITY |
60 | 11.9.14 QUERY FEATURE TYPE 11.9.15 QUERY NEXT FEATURE TYPE 11.9.16 QUERY EVENT FILTER 0-7 11.9.17 QUERY EVENT FILTER 8-15 11.9.18 QUERY EVENT FILTER 16-23 11.10 Special commands 11.10.1 General 11.10.2 TERMINATE |
61 | 11.10.3 INITIALISE (device) 11.10.4 RANDOMISE 11.10.5 COMPARE 11.10.6 WITHDRAW Table 23 – Device addressing with “INITIALISE (device)” |
62 | 11.10.7 SEARCHADDRH (data) 11.10.8 SEARCHADDRM (data) 11.10.9 SEARCHADDRL (data) 11.10.10 PROGRAM SHORT ADDRESS (data) 11.10.11 VERIFY SHORT ADDRESS (data) |
63 | 11.10.12 QUERY SHORT ADDRESS 11.10.13 WRITE MEMORY LOCATION (DTR1, DTR0, data) 11.10.14 WRITE MEMORY LOCATION – NO REPLY (DTR1, DTR0, data) 11.10.15 DTR0 (data) |
64 | 11.10.16 DTR1 (data) 11.10.17 DTR2 (data) 11.10.18 DIRECT WRITE MEMORY (DTR1, offset, data) 11.10.19 DTR1:DTR0 (data1, data0) 11.10.20 DTR2:DTR1 (data2, data1) 11.10.21 SEND TESTFRAME (data) |
65 | 12 Test procedures 12.1 General notes on test 12.1.1 General 12.1.2 Test execution |
66 | 12.1.3 Data transmission 12.1.4 Test setup 12.1.5 Test output |
67 | 12.1.6 Test notation |
68 | 12.1.7 Test execution limitations 12.1.8 Test results 12.1.9 Exception handling 12.1.10 Unexpected answer |
69 | Table 24 – Unexpected outcome |
70 | 12.2 Preamble 12.2.1 Test preamble |
76 | Table 25 – Parameters for test sequence Check Factory Default 103 |
79 | Table 26 – Parameters for test sequence CheckFactoryDefault103PerLogicalUnit |
81 | 12.3 Physical operational parameters 12.3.1 Polarity test Table 27 – Parameters for test sequence Transmitter bit timing |
82 | 12.3.2 Maximum and minimum system voltage 12.3.3 Overvoltage protection test Table 28 – Parameters for test sequence Maximum and minimum system voltage |
83 | 12.3.4 Current rating test |
84 | Figure 2 – Current rating test |
85 | 12.3.5 Transmitter voltages |
86 | 12.3.6 Transmitter rising and falling edges Table 29 – Parameters for test sequence Transmitter voltages |
87 | Table 30 – Parameters for test sequence Transmitter rising and falling edges |
88 | 12.3.7 Transmitter bit timing |
90 | 12.3.8 Transmitter frame timing Table 31 – Parameters for test sequence Transmitter bit timing |
91 | 12.3.9 Receiver start-up behavior Table 32 – Parameters for test sequence Receiver frame timing |
92 | 12.3.10 Receiver threshold Table 33 – Parameters for test sequence Receiver start-up behavior |
93 | 12.3.11 Receiver bit timing |
94 | Table 34 – Parameters for test sequence Receiver bit timing |
97 | 12.3.12 Extended receiver bit timing |
98 | Table 35 – Parameters for test sequence extended receiver bit timing |
99 | 12.3.13 Receiver forward frame violation 12.3.14 Receiver settling timing Table 36 – Parameters for test sequence Receiver frame violationand recovering after frame size violation |
100 | 12.3.15 Receiver frame timing FF-FF send twice Table 37 – Parameters for test sequence Receiver frame timing |
102 | 12.3.16 Transmitter collision avoidance by priority |
103 | 12.3.17 Transmitter collision detection for truncated idle phase Table 38 – Parameters for test sequence transmitter collision avoidance by priority |
106 | 12.3.18 Transmitter collision detection for extended active phase Table 39 – Parameters for test sequence transmittercollision detection for truncated idle phase |
109 | 12.4 Device configuration instructions 12.4.1 RESET deviceGroups Table 40 – Parameters for test sequence transmittercollision detection for extended active phase |
110 | 12.4.2 RESET quiescentMode |
111 | 12.4.3 RESET instance groups |
112 | 12.4.4 RESET event filter Table 41 – Parameters for test sequence RESET instance groups |
113 | 12.4.5 RESET event scheme |
114 | 12.4.6 RESET: timeout / command in-between |
116 | 12.4.7 Send twice timeout (device) |
118 | Table 42 – Parameters for test sequence Send twice timeout (device) |
119 | 12.4.8 Send twice timeout (instance) |
120 | Table 43 – Parameters for test sequence Send twice timeout (instance) |
121 | 12.4.9 Commands in-between (device) |
123 | Table 44 – Parameters for test sequence Commands in-between (device) |
124 | 12.4.10 Commands in-between (instance) |
126 | Table 45 – Parameters for test sequence Commands in-between |
127 | 12.4.11 SAVE PERSISTENT VARIABLES 12.4.12 SET OPERATING MODE |
128 | 12.4.13 Device Disable/Enable Application Controller |
129 | 12.4.14 Multi Master Control Device PING |
130 | 12.4.15 Quiescent Mode |
131 | 12.4.16 Device power cycle notification |
132 | 12.4.17 SET SHORT ADDRESS |
133 | 12.4.18 Reset/Power-on values (device) Table 46 – Parameters for test sequence SET SHORT ADDRESS |
134 | Table 47 – Parameters for test sequence Reset/Power-on values (device) |
135 | 12.4.19 Reset/Power-on values (instance) |
136 | 12.4.20 DTR0 / DTR1 / DTR2 Table 48 – Parameters for test sequence Reset/Power-on values (instance) Table 49 – Parameters for test sequence DTR0 / DTR1 / DTR2 |
137 | 12.4.21 DTR1:DTR0 and DTR2:DTR1 |
138 | 12.4.22 Device Groups Table 50 – Parameters for test sequence DTR1:DTR0 and DTR2:DTR1 |
139 | 12.5 Device queries 12.5.1 Device query capabilities 12.5.2 QUERY VERSION NUMBER |
140 | 12.5.3 Device power cycle seen 12.5.4 Input device error |
141 | 12.6 Device Memory banks 12.6.1 READ MEMORY LOCATION on Memory Bank 0 |
145 | Table 51 – Parameters for test sequence READ MEMORY LOCATION on Memory Bank 0 |
146 | 12.6.2 READ MEMORY LOCATION on Memory Bank 1 |
148 | 12.6.3 READ MEMORY LOCATION on other Memory Banks Table 52 – Parameters for test sequence READ MEMORY LOCATION on Memory Bank 1 |
150 | 12.6.4 Memory bank writing |
153 | Table 53 – Parameters for test sequence Memory bank writing |
155 | 12.6.5 ENABLE WRITE MEMORY: writeEnableState |
156 | Table 54 – Parameters for test sequence ENABLE WRITE MEMORY: writeEnableState |
157 | 12.6.6 ENABLE WRITE MEMORY: timeout / command in-between |
158 | 12.6.7 RESET MEMORY BANK: timeout / command in-between Table 55 – Parameters for test sequence ENABLE WRITE MEMORY: timeout / command in-between |
161 | 12.6.8 RESET MEMORY BANK Table 56 – Parameters for test sequence RESET MEMORY BANK:timeout / command in-between |
162 | 12.7 Device Special commands 12.7.1 INITIALISE – timer Table 57 – Parameters for test sequence RESET MEMORY BANK |
163 | 12.7.2 TERMINATE |
164 | 12.7.3 INITIALISE – device addressing Table 58 – Parameters for test sequence INITIALISE – device addressing |
165 | 12.7.4 RANDOMISE 12.7.5 COMPARE |
166 | Table 59 – Parameters for test sequence COMPARE |
167 | 12.7.6 WITHDRAW |
168 | 12.7.7 SEARCHADDRH / SEARCHADDRM / SEARCHADDRL Table 60 – Parameters for test sequence WITHDRAW |
169 | 12.7.8 PROGRAM SHORT ADDRESS |
170 | Table 61 – Parameters for test sequence PROGRAM SHORT ADDRESS |
171 | 12.7.9 VERIFY SHORT ADDRESS |
172 | 12.7.10 QUERY SHORT ADDRESS Table 62 – Parameters for test sequence VERIFY SHORT ADDRESS |
173 | Table 63 – Parameters for test sequence QUERY SHORT ADDRESS |
174 | 12.7.11 IDENTIFY DEVICE |
175 | Table 64 – Parameters for test sequence IDENTIFY DEVICE |
176 | 12.8 Logical unit cross contamination 12.8.1 DTR0 12.8.2 NVM variables |
177 | 12.8.3 Random address generation |
178 | 12.8.4 Addressing 1 |
179 | 12.8.5 Addressing 2 |
181 | 12.8.6 Addressing 3 Table 65 – Parameters for test sequence Addressing 2 |
182 | 12.9 Instance addressing 12.9.1 Instance Type Addressing |
183 | 12.9.2 Instance Primary Group |
184 | 12.9.3 Instance Group 2 |
186 | 12.9.4 Instance Group 1 |
187 | 12.9.5 Instance Group Combinations |
189 | 12.9.6 Multiple Instances Answer |
190 | 12.10 Instance configuration instructions 12.10.1 Instance Enable/Disable |
192 | 12.10.2 Event Scheme |
197 | 12.10.3 Input Resolution & Input Value 12.10.4 Event Filter |
198 | 12.11 Instance queries 12.11.1 Instance Number and Types |
199 | 12.11.2 Instance Status 12.11.3 Instance Error |
200 | 12.12 Instance cross contamination 12.12.1 Instance Event Priority |
201 | 12.13 Reserved Commands 12.13.1 Reserved standard device commands Table 66 – Parameters for test sequence Reserved commands:standard device commands |
202 | 12.13.2 Reserved instance commands (instance type 0) 12.13.3 Reserved special commands Table 67 – Parameters for test sequence Reserved instance commands (instance type 0) |
203 | 12.14 General subsequences 12.14.1 Reset Device Table 68 – Parameters for test sequence Reserved special commands |
204 | 12.14.2 EnableApplicationControllerAndAllInstances 12.14.3 DisableApplicationControllerAndAllInstances 12.14.4 HasApplicationController |
205 | 12.14.5 GetVersionNumber 12.14.6 AddDeviceGroups 12.14.7 RemoveDeviceGroups |
206 | 12.14.8 ClearAllDeviceGroups 12.14.9 CheckDeviceGroups |
207 | 12.14.10 GetDeviceGroups 12.14.11 PowerCycle 12.14.12 PowerCycleAndWaitForBusPower |
208 | 12.14.13 PowerCycleAndWaitForDecoder 12.14.14 SetupTestFrame |
209 | 12.14.15 GetNumberOfInstances 12.14.16 GetEventFilter 12.14.17 SetEventFilter 12.14.18 GetNumberOfLogicalUnits 12.14.19 GetIndexOfLogicalUnit |
210 | 12.14.20 GetRandomAddress 12.14.21 GetLimitedRandomAddress 12.14.22 SetSearchAddress |
211 | 12.14.23 SetShortAddress 12.14.24 ReadMemBankMultibyteLocation |
212 | 12.14.25 FindImplementedMemoryBank 12.14.26 FindAllImplementedMemoryBanks |
213 | 12.14.27 ShortAddress 12.14.28 GroupAddress 12.14.29 Broadcast 12.14.30 BroadcastUnaddressed 12.14.31 InstanceNumber |
214 | 12.14.32 InstanceGroup 12.14.33 InstanceType 12.14.34 InstanceBroadcast 12.14.35 FeatureOfInstanceNumber |
215 | 12.14.36 FeatureOfInstanceGroup 12.14.37 FeatureOfInstanceType 12.14.38 FeatureOfInstanceBroadcast 12.14.39 FeatureOfDevice |
216 | 12.14.40 FeatureOfDeviceWithGroupAddress 12.14.41 FeatureOfDeviceWithBroadcast |
217 | Bibliography |