BS EN 62416:2010
$86.31
Semiconductor devices. Hot carrier test on MOS transistors
| Published By | Publication Date | Number of Pages |
| BSI | 2010 | 14 |
This standard describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 5 | English CONTENTS |
| 6 | 1 Scope 2 Abbreviations and letter symbols |
| 7 | 3 Test structures 4 Stress time 5 Stress conditions |
| 8 | 6 Sample size 7 Temperature 8 Failure criteria 9 Lifetime estimation method 9.1 DC acceleration models |
| 10 | 9.2 AC estimation model 10 Lifetime requirements 11 Reporting |
| 11 | Bibliography |
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BS EN 62416:2010
Semiconductor devices. Hot carrier test on MOS transistors Published By Publication Date Number of Pages…
