BS EN 62493:2015+A1:2022
$215.11
Assessment of lighting equipment related to human exposure to electromagnetic fields
Published By | Publication Date | Number of Pages |
BSI | 2022 | 72 |
PDF Catalog
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7 | CONTENTS |
11 | FOREWORD |
13 | INTRODUCTION |
14 | 1 Scope 2 Normative references |
15 | 3 Terms, definitions, physical quantities, units and abbreviations 3.1 Terms and definitions |
17 | 3.2 Physical quantities and units Tables Table 1 – Physical quantities and units |
18 | 3.3 Abbreviations 4 Limits 4.1 General 4.2 Unintentional radiating part of lighting equipment 4.2.1 General |
19 | 4.2.2 Lighting equipment deemed to comply with the Van der Hoofden test without testing 4.2.3 Application of limits 4.3 Intentional radiating part of lighting equipment |
20 | 5 General requirements Van der Hoofden test 5.1 Measurand 5.2 Supply voltage and frequency Figures Figure 1 – Compliance routes and pass/fail criteria for lighting equipment |
21 | 5.3 Measurement frequency range 5.4 Ambient temperature 5.5 Measurement equipment requirements Table 2 – Receiver or spectrum analyser settings |
22 | Figure 2 – The Van der Hoofden test head Figure 3 – Example of a protection circuit |
23 | 5.6 Measurement instrumentation uncertainty 5.7 Test report 5.8 Evaluation of results 6 Measurement procedure for the Van der Hoofden test 6.1 General |
24 | 6.2 Operating conditions 6.2.1 Operating conditions for lighting equipment 6.2.2 Operating conditions for specific lighting equipment 6.2.3 Operating conditions for lighting equipment with intentional radiators 6.3 Measurement distance 6.4 Measurement set-up 6.4.1 General |
25 | 6.4.2 Measurement set-up for specific lighting equipment 6.5 Location of measurement test head Figure 4 – Measurement set-up |
26 | 6.6 Calculation of the results 7 Assessment procedure intentional radiators 7.1 General 7.2 Low-power exclusion method 7.2.1 General 7.2.2 Determination of the total radiated power 7.2.3 Determination of the low-power exclusion level |
27 | 7.2.4 Summation of multiple transmitters 7.3 Application of the EMF product standard for body worn-equipment 7.4 Application of the EMF product standard for base stations 7.5 Application of another EMF standard |
28 | Figure 5 – Compliance demonstration procedure for the intentional-transmitter part of the lighting equipment |
29 | Annexes Annex A (normative) Measurement distances Table A.1 – Lighting equipment and measurement distances |
30 | Annex B (informative) Location of measurement test head Figure B.1 – Location of measurement point in the transverse direction of lighting equipment – side view Figure B.2 – Location of measurement points in the longitude direction of lighting equipment – side view |
31 | Figure B.3 – Location of measurement points in the longitude direction of lighting equipment; in the direction of illumination Figure B.4 – Location of measurement point for lighting equipment with rotationally symmetrical dimensions |
32 | Figure B.5 – Location of measurement point for lighting equipment with rotationally symmetrical dimensions; in the direction of illumination Figure B.6 – Location of measurement point for lighting equipment with the same dimensions in the x- and y- axis |
33 | Figure B.7 – Location of measurement point(s) for lighting equipment with single capped lamp (360° illumination) Figure B.8 – Location of measurement points for lighting equipment with a remote controlgear |
34 | Figure B.9 – Location of measurement point for an independent electronic converter Figure B.10 – Location of measurement point(s) for an uplighter (floor standing/suspended) |
35 | Annex C (informative) Exposure limits C.1 General C.2 ICNIRP basic restrictions C.2.1 Basic restrictions – SAR C.2.2 Basic restrictions – Internal electric field C.2.3 Changes introduced by ICNIRP 2020 with respect to ICNIRP 1998 and ICNIRP 2010 Table C.1 – Basic restrictions for general public exposure to time varying electric and magnetic fields for frequencies between 100 kHz and 300 GHz Table C.2 – Basic restrictions for general public exposure to time varying electric and magnetic fields for frequencies up to 10 MHz |
36 | C.3 IEEE Table C.3 – IEEE basic restrictions (BR) for the general public Table C.4 – IEEE basic restrictions (BR) between 100 kHz and 3 GHz for the general public |
37 | Annex D (informative) Rationale measurement and assessment method D.1 General D.2 Induced internal electric field D.2.1 General Figure D.1 – Overview measurement and assessment method |
39 | D.2.2 Induced electric field due to the magnetic field; Eeddy(fi,dloop) Figure D.2 – Distances of the head, loop and measurement set-up |
40 | Table D.1 – Induced internal electric field calculations |
41 | Figure D.3 – Maximum current in the 2 m LLA as function of the frequency |
43 | Figure D.4 – Induced internal electric field and associated limit levels |
44 | D.2.3 Induced electric field due to the electric field; Ecap(fi,d) Figure D.5 – Example of magnetic-field test result using the LLA |
45 | Figure D.6 – Distances of the head and measurement set-up Figure D.7 – Plot of Equation (D.20) |
46 | Table D.2 – Calculation main contributions |
47 | D.3 Thermal effects from 100 kHz to 300 GHz D.3.1 General Table D.3 – Frequency steps for the amplitude addition that equals 1,11 times B6 |
48 | D.3.2 The 100 kHz to 30 MHz contribution to the thermal effects Table D.4 – Frequency steps for the power addition that equals 0,833 times B6 |
49 | D.3.3 The 30 MHz to 300 MHz contribution to the thermal effects Figure D.8 – Example of the CM-current measured using a conducted emission test Table D.5 – Field strength limits according to CISPR 15 |
50 | D.3.4 Overall conclusion for the contribution to thermal effects |
51 | Annex E (normative) Practical internal electric-field measurement and assessment method E.1 Measurement of induced internal electric field E.2 Calculation program |
52 | E.3 Compliance criterion for the Van der Hoofden head test Table E.1 – Conductivity as a function of frequency (see Table C.1 of IEC 62311:2007) |
53 | Annex F (normative) Protection network F.1 Calibration of the protection network Figure F.1 – Test set-up for normalization of the network analyser |
54 | F.2 Calculation of the theoretical characteristic of the protection network Figure F.2 – Test set-up for measurement of the voltage division factor using a network analyser |
55 | Figure F.3 – Calculated theoretical characteristic for the calibration of the protection network |
56 | Annex G (informative) Measurement instrumentation uncertainty Table G.1 – Uncertainty calculation for the measurement method described in Clauses 5 and 6 in the frequency range from 20 kHz to 10 MHz |
57 | Table G.2 – Comments and information to Table G.1 |
58 | Annex H (informative) Equipment deemed to comply |
59 | Figure H.1 – Flow chart to determine applicability deemed to comply without F factor measurement |
60 | Annex I (informative) Intentional radiators I.1 General I.2 Intentional radiators in lighting equipment I.3 Properties of antennas in lighting applications |
61 | Table I.1 – Overview of wireless radio technologies that might be applied in lighting systems |
62 | Figure I.1 – Luminaire with a transmitting antenna in a room |
63 | Figure I.2 – Impact of a conducting ceiling/plane |
64 | Figure I.3 – Electric field of a small electrical dipole: analytical formula vs far-field approximation |
65 | Figure I.4 – Electric field as a function of distance, antenna gain and input power (far-field approximation) |
66 | I.4 Exposure assessment approach I.4.1 General I.4.2 Determination of average total radiated power Pint,rad Figure I.5 – Impact of pulsed signals on the average exposure |
67 | I.4.3 Determination of the low-power exclusion level Pmax I.5 Multiple transmitters in a luminaire |
68 | I.6 Exposure to multiple luminaires I.7 References in Annex I |
70 | Bibliography |