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BS EN 62506:2013

BS EN 62506:2013

$215.11

Methods for product accelerated testing

Published By Publication Date Number of Pages
BSI 2013 92
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IEC 62506:2013 provides guidance on the application of various accelerated test techniques for measurement or improvement of product reliability. Identification of potential failure modes that could be experienced in the use of a product/item and their mitigation is instrumental to ensure dependability of an item. The object of the methods is to either identify potential design weakness or provide information on item dependability, or to achieve necessary reliability/availability improvement, all within a compressed or accelerated period of time. This standard addresses accelerated testing of non-repairable and repairable systems. It can be used for probability ratio sequential tests, fixed duration tests and reliability improvement/growth tests, where the measure of reliability may differ from the standard probability of failure occurrence. This standard also extends to present accelerated testing or production screening methods that would identify weakness introduced into the product by manufacturing error, which could compromise product dependability. Keywords: test techniques for measurement or improvement of product reliability

PDF Catalog

PDF Pages PDF Title
6 English
CONTENTS
9 INTRODUCTION
10 1 Scope
2 Normative references
11 3 Terms, definitions, symbols and abbreviations
3.1 Terms and definitions
13 3.2 Symbols and abbreviated terms
14 4 General description of the accelerated test methods
4.1 Cumulative damage model
15 Figures
Figure 1 – Probability density functions (PDF) for cumulative damage, degradation, and test types
16 4.2 Classification, methods and types of test acceleration
4.2.1 General
Tables
Table 1 – Test types mapped to the product development cycle
17 4.2.2 Type A: qualitative accelerated tests
4.2.3 Type B: quantitative accelerated tests
18 4.2.4 Type C: quantitative time and event compressed tests
19 5 Accelerated test models
5.1 Type A, qualitative accelerated tests
5.1.1 Highly accelerated limit tests (HALT)
20 Figure 2 – Relationship of PDFs of the product strength vs. load in use
21 Figure 3 – How uncertainty of load and strength affects the test policy
22 Figure 4 – PDFs of operating and destruct limits as a function of applied stress
23 5.1.2 Highly accelerated stress test (HAST)
5.1.3 Highly accelerated stress screening/audit (HASS/HASA)
24 5.1.4 Engineering aspects of HALT and HASS
25 5.2 Type B and C – Quantitative accelerated test methods
5.2.1 Purpose of quantitative accelerated testing
5.2.2 Physical basis for the quantitative accelerated Type B test methods
26 5.2.3 Type C tests, time (C1) and event (C2) compression
28 5.3 Failure mechanisms and test design
29 5.4 Determination of stress levels, profiles and combinations in use and test – stress modelling
5.4.1 General
5.4.2 Step-by-step procedure
5.5 Multiple stress acceleration methodology – Type B tests
32 5.6 Single and multiple stress acceleration for Type B tests
5.6.1 Single stress acceleration methodology
36 Figure 5 – Line plot for Arrhenius reaction model
37 Figure 6 – Plot for determination of the activation energy
39 5.6.2 Stress models with stress varying as a function of time – Type B tests
40 5.6.3 Stress models that depend on repetition of stress applications – Fatigue models
42 5.6.4 Other acceleration models – Time and event compression
5.7 Acceleration of quantitative reliability tests
5.7.1 Reliability requirements, goals, and use profile
44 5.7.2 Reliability demonstration or life tests
47 Figure 7 – Multiplier of the test stress duration for demonstration ofrequired reliability for compliance or reliability growth testing
48 Figure 8 – Multiplier of the duration of the load application for the desired reliability
49 5.7.3 Testing of components for a reliability measure
50 5.7.4 Reliability measures for components and systems/items
5.8 Accelerated reliability compliance or evaluation tests
52 5.9 Accelerated reliability growth testing
5.10 Guidelines for accelerated testing
5.10.1 Accelerated testing for multiple stresses and the known use profile
53 5.10.2 Level of accelerated stresses
5.10.3 Accelerated reliability and verification tests
6 Accelerated testing strategy in product development
6.1 Accelerated testing sampling plan
54 6.2 General discussion about test stresses and durations
55 6.3 Testing components for multiple stresses
6.4 Accelerated testing of assemblies
6.5 Accelerated testing of systems
6.6 Analysis of test results
7 Limitations of accelerated testing methodology
57 Annex A (informative) Highly accelerated limit test (HALT)
58 Table A.1 – Summary of HALT test results for a DC/DC converter
59 Table A.2 – Summary of HALT results from a medical system
60 Table A.3 – Summary of HALT results for a Hi-Fi equipment
61 Annex B (informative) Accelerated reliability compliance and growth test design
63 Figure B.1 – Reliability as a function of multiplier kand for combinations of parameters a and b
65 Table B.1 – Environmental stress conditions of anautomotive electronic device
66 Figure B.2 – Determination of the multiplier k
69 Table B.2 – Product use parameters
73 Table B.3 – Assumed product use profile
74 Table B.4 – Worksheet for determination of use times to failures
75 Figure B.3 – Determination of the growth rate
Table B.5 – Data for reliability growth plotting
76 Annex C (informative) Comparison between HALT and conventional accelerated testing
Table C.1 – Comparison between HALT and conventional accelerated testing
77 Annex D (informative) Estimating the activation energy, Ea
78 Figure D.1 – Plotting failures to estimate the activation energy Ea
79 Annex E (informative) Calibrated accelerated life testing (CALT)
81 Annex F (informative) Example on how to estimate empirical factors
82 Table F.1 – Probability of failure of test samples A and B
Table F.2 – Data transformation for Weibull plotting
83 Figure F.1 – Weibull graphical data analysis
84 Figure F.2 – Scale parameter as a function of the temperature range
85 Figure F.3 – Probability of failure as a function of number of cycles ΔT = 50 °C
86 Annex G (informative) Determination of acceleration factors by testing to failure
Table G.1 – Voltage test failure data for Weibull distribution
87 Figure G.1 – Weibull plot of the three data sets
88 Figure G.2 – Scale parameters’ values fitted with a power line
89 Bibliography

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BS EN 62506:2013
$215.11