BS EN IEC 60444-6:2021 – TC:2022 Edition
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Tracked Changes. Measurement of quartz crystal unit parameters – Measurement of drive level dependence (DLD)
Published By | Publication Date | Number of Pages |
BSI | 2022 | 62 |
PDF Catalog
PDF Pages | PDF Title |
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1 | 30454869 |
37 | A-30406253 |
38 | undefined |
41 | Annex ZA (normative)Normative references to international publicationswith their corresponding European publications |
43 | English CONTENTS |
44 | FOREWORD |
46 | INTRODUCTION |
47 | 1 Scope 2 Normative references 3 Terms and definitions 4 DLD effects 4.1 Reversible changes in frequency and resistance |
48 | 4.2 Irreversible changes in frequency and resistance 4.3 Causes of DLD effects 5 Drive levels for DLD measurement |
49 | 6 Test methods 6.1 Method A (fast standard measurement method) 6.1.1 Testing at two drive levels |
50 | 6.1.2 Testing according to specification Figure 1 – Maximum tolerable resistance ratio for the drive level dependence as a function of the resistances or |
51 | 6.2 Method B (Multi-level reference measurement method) |
53 | Annex A (normative) Relationship between electrical drive level and mechanical displacement of quartz crystal units |
56 | Annex B (normative) Method C: DLD measurement with oscillation circuit Figure B.1 – Insertion of a quartz crystal unit in an oscillator |
57 | Figure B.2 – Crystal unit loss resistance as a function of dissipated power |
58 | Figure B.3 – Behaviour of the of a quartz crystal unit Figure B.4 – Block diagram of circuit system |
59 | Figure B.5 – Installed in scanned drive level range Figure B.6 – Drive level behaviour of a quartz crystal unit if −Rosc = 70 Ω is used as test limit in the Annex B test |
60 | Figure B.7 – Principal schematic diagram of the go/no-go test circuit |
61 | Bibliography |