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BS EN IEC 60512-27-200:2022

BS EN IEC 60512-27-200:2022

$167.15

Connectors for electrical and electronic equipment. Tests and measurements – Additional specifications for signal integrity tests up to 2 000 MHz on IEC 60603-7 series connectors. Tests 27a to 27g

Published By Publication Date Number of Pages
BSI 2022 36
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IEC 60512-27-200:2022 is primarily intended for use in signal integrity and transmission performance testing up to 2 000 MHz of IEC 60603-7 series 8-way connector type IEC 60603‑7‑81, according to connector test method IEC 60512‑28‑100. This part of IEC 60512 covers additional, supplemental test method specifications to extend the upper frequency for the test connectors and associated indirect-reference test fixtures used in the signal integrity and transmission performance tests specified in IEC 60512‑27‑100. In support of de-embedded crosstalk and related transmission requirements specified in IEC 60603‑7‑81, for frequencies up to 2 000 MHz, these supplemental specifications extend the upper test frequency from IEC 60512‑27‑100 up to 500 MHz to the upper test frequency of IEC 60512‑28‑100 up to 2 000 MHz. This document covers measurements of connector signal integrity and transmission performance of 8-way connector types defined in these published connector series standards: – IEC 60603‑7‑2 – IEC 60603‑7‑3 – IEC 60603‑7‑4 – IEC 60603‑7‑5 – IEC 60603‑7‑41 – IEC 60603‑7‑51 – IEC 60603‑7‑81. This document covers respective performance test procedures of connector signal integrity and transmission performance defined in these published connector test method series standards: – IEC 60512‑26‑100 – IEC 60512‑27‑100 – IEC 60512‑28‑100.

PDF Catalog

PDF Pages PDF Title
2 undefined
7 Annex ZA (normative)Normative references to international publicationswith their corresponding European publications
9 English
CONTENTS
11 FOREWORD
13 INTRODUCTION
14 1 Scope
15 2 Normative references
16 3 Terms and definitions
4 Test connector specifications
4.1 General
17 4.2 Indirect-reference test fixtures
Tables
Table 1 – IEC 606037 series, 8-way connector types standards and respective connector test method standards
18 4.3 Category 8.1 test plug requirements
4.3.1 General
4.3.2 Category 8.1 test plug NEXT loss requirements
4.3.3 Category 8.1 test plug return loss requirements
Table 2 – Category 8.1 test plug NEXT loss ranges
19 4.4 Category 8.1 cord test head requirements
4.4.1 General
4.4.2 Category 8.1 cord test head return loss
Table 3 – Category 8.1 test plug return loss requirements
Table 4 – Category 8.1 cord test head return loss
20 Annex A (informative) Test connectors specifications
A.1 General
A.2 Test plug specifications
A.2.1 General
A.2.2 Test plug NEXT loss limit vectors
Table A.1 – Category 6, 6A and 8.1 test plug NEXT loss limit vectors
21 A.2.3 Mated connector NEXT loss specifications
A.2.4 Test plug NEXT loss specifications
Table A.2 – Category 5e test plug NEXT loss limit vectors
Table A.3 – Category 6, 6A and 8.1 mated connector NEXT loss specificationsfor case 1 and case 4
22 Table A.4 – Category 5e, 6, and 6A test plug NEXT loss ranges
23 A.2.5 Test plug phase reference plane and calibration planes
Table A.5 – Category 8.1 test plug NEXT loss ranges
24 A.2.6 Device delay measurements
Figures
Figure A.1 – Calibration planes, test plug phase reference plane, and port extensions
26 A.3 Cord test head specifications
A.3.1 General
A.3.2 Cord test head NEXT loss, centred
A.3.3 Cord test head FEXT loss
A.3.4 Cord test head return loss
Table A.6 – Category 5e, 6, and 6A cord test head return loss
27 Table A.7 – Category 8.1 cord test head return loss
28 Annex B (informative) Balun measurement procedures use of test plugs and test heads
B.1 General
B.2 Example balun measurement test configuration for permanent link insertion loss
B.3 Example balun measurement test configuration for direct attach cord insertion loss
Figure B.1 – Example balun measurement test configuration forpermanent link insertion loss
29 Figure B.2 – Example balun measurement test configuration fordirect attach cord insertion loss
30 Annex C (informative) Balunless measurement procedures use of test plugs and test heads
C.1 General
C.2 Example balunless measurement test configuration for permanent link insertion loss
C.3 Example balunless measurement test configuration for direct attach cord insertion loss
Figure C.1 – Example balunless measurement test configuration forpermanent link insertion loss
31 Figure C.2 – Example balunless measurement test configuration fordirect attach cord insertion loss
32 Annex D (informative) Connector test fixtures
D.1 General
D.2 Overall test setup
Table D.1 – Overall test setup specifications
33 D.3 Indirect-reference test fixtures
D.3.1 Indirect-reference test fixtures basic specifications
D.3.2 Indirect-reference test fixtures additional specifications
D.4 Direct-probe test fixtures
D.4.1 Direct-probe test fixtures basic specifications
D.4.2 Direct-probe test fixtures additional specifications
34 D.4.3 Direct-probe test fixtures for test plug measurements
Table D.2 – Direct-probe test fixture general specifications
Table D.3 – Direct probe fixture for test plugs measurements – specifications
35 Bibliography

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