BS EN IEC 60747-17:2020:2021 Edition
$198.66
Semiconductor devices – Magnetic and capacitive coupler for basic and reinforced insulation
Published By | Publication Date | Number of Pages |
BSI | 2021 | 58 |
IEC 60747-17:2020(E) specifies the terminology, essential ratings, characteristics, safety test and the measuring methods of magnetic coupler and capacitive coupler. It specifies the principles and requirements of insulation and isolation characteristics for magnetic and capacitive couplers for basic insulation and reinforced insulation. This first edition cancels and replaces IEC PAS 60747-17:2011. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to IEC PAS 60747-17:2011: a) introduced lifetime safety factors for improved life time consideration, to comply with widely recognized aging mechanisms of silicone dioxide (TDDB) and thin film polymer isolation layers; b) significantly improved “end of life testing” paragraph and statistical life time consideration by adding detailed description on process, safety factors, methods of generating data points and respective lifetime interpolations as well as being specific on minimum amount of samples required; c) introduced concept of certification by similarity, including Annex A, giving guidance on qualification considerations and required certification process; d) alternative pulse shape allowed for surge pulse testing, to avoid issues due to surge tester availability; e) various improvements throughout the standard: definitions, for example type of coupler have been improved, introduction of surge impulse VIMP rating, usage of glass transition temperature, pre-conditioning have been redefined for improved usability and better compatibility with today’s design and functionality of couplers, available mold compounds, etc.
PDF Catalog
PDF Pages | PDF Title |
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2 | undefined |
5 | Annex ZA(normative)Normative references to international publicationswith their corresponding European publications |
7 | CONTENTS |
10 | FOREWORD |
12 | 1 Scope 2 Normative references |
13 | 3 Terms and definitions |
20 | Figures Figure 1 – Time intervals for methods a and b of the test voltage |
24 | 4 Electrical characteristics – Coupler logic and timing definitions Tables Table 1 – Overview on characteristics and symbols |
25 | 5 Coupler for protection against electrical shock 5.1 General 5.2 Type 5.3 Ratings 5.3.1 General 5.3.2 Safety limiting values 5.3.3 Functional ratings 5.3.4 Rated isolation voltages 5.4 Electrical safety requirements |
26 | 5.5 Electrical, environmental and/or endurance test information 5.5.1 General Table 2 – Datasheet characteristics |
27 | Table 3 – Tests and test sequence for coupler providing basic insulation and reinforced insulation for protection against electrical shock |
28 | 5.5.2 Routine test 5.5.3 Sample test 5.5.4 Maximum surge isolation voltage Table 4 – Test conditions |
29 | 5.5.5 Type test Figure 2 –1,2/50 (s surge pulse according 61000-4-5:2014 allowed as equivalent impulse for isolation testing |
36 | Figure 3 – Determination of time to failure (referring to method in 5.5.5.8) |
37 | Figure 4 – Determination of working voltage (referring to method in 5.5.5.8 for exponential model) |
38 | Figure 5 – Determination of working voltage (referring to method in 5.5.5.8 for non-linear model) |
40 | 6 Measuring methods for couplers 6.1 General 6.2 Isolation capacitance (ClO) 6.2.1 Purpose 6.2.2 Circuit diagram |
41 | 6.2.3 Measurement procedure 6.2.4 Precautions to be observed 6.2.5 Special conditions 6.3 Isolation resistance between input and output, RlO 6.3.1 Purpose 6.3.2 Circuit diagram Figure 6 – Isolation capacitance measurement circuit |
42 | 6.3.3 Precautions to be observed 6.3.4 Measurement procedure 6.3.5 Special conditions 6.4 Isolation test 6.4.1 Purpose 6.4.2 Circuit diagram Figure 7 – Isolation resistance measurement circuit |
43 | 6.4.3 Test procedure 6.4.4 Requirements Figure 8 – Isolation voltage measurement circuit |
44 | 6.5 Partial discharges of coupler 6.5.1 Purpose 6.5.2 Circuit diagram 6.5.3 Description of Figure 9 test circuit and requirements Figure 9 – Partial discharge test circuit |
45 | 6.5.4 Test procedure 6.5.5 Description of calibration circuit (see Figure 10) Figure 10 – Connections for the calibration of the complete test arrangement |
46 | 6.5.6 Test methods 6.5.7 Specified conditions Table 5 – Safety factor F |
47 | 6.5.8 Test voltage conditions 6.6 Switching times of couplers 6.6.1 Purpose 6.6.2 Circuit diagram Table 6 – Specified conditions for method a and method b |
48 | 6.6.3 Measurement procedure Figure 11 – Switching time test circuit Figure 12 – Transition time waveform measurement |
49 | 6.6.4 Specified conditions 6.7 Measuring methods of common-mode transient immunity (CMTI) for magnetic and capacitive couplers 6.7.1 Purpose 6.7.2 Circuit diagram Figure 13 – Propagation delay time waveform measurement |
50 | 6.7.3 Precautions to be observed Figure 14 – Static versus dynamic data source signal VI Figure 15 – Common-mode transient immunity (CMTI) test setup for both static and dynamic testing |
51 | 6.7.4 Static CMTI measuring procedure |
52 | 6.7.5 Specified conditions 6.7.6 Dynamic CMTI measuring procedure Figure 16 – Static common-mode transient immunity (CMTI) and VCM and low to high data transition waveform |
53 | Annex A (informative) Qualification guidance |
54 | Figure A.1 – Lifetime verification Table A.1 – Front end process changes within component |
55 | Table A.2 – Front End Process Changes within SiO/SiN/imide-passivation Table A.3 – Layout changes Table A.4 – Backend changes |
56 | Bibliography |