BS EN IEC 61169-1-4:2020
$102.76
Radio-frequency connectors – Electrical test methods. Voltage standing wave ratio, return loss and reflection coefficient
| Published By | Publication Date | Number of Pages |
| BSI | 2020 | 20 |
IEC 61169-1-4:2020 provides test methods for the voltage standing wave ratio, return loss and reflection coefficient of RF connectors, including frequency domain method, time domain method, and gating. This document is applicable to cable RF connectors, microstrip RF connectors and RF adapters. It is also suitable to RF channels in multi-RF channel connectors and hybrid connectors.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 2 | undefined |
| 5 | Annex ZA(normative)Normative references to international publicationswith their corresponding European publications |
| 7 | English CONTENTS |
| 8 | FOREWORD |
| 10 | 1 Scope 2 Normative references 3 Terms and definitions |
| 11 | 4 Preparation of test sample (DUT) 4.1 Cable RF connector |
| 12 | 4.2 Microstrip connector 4.3 Adapter 5 Typical graphical symbols Figures Figure 1 – Dual-connector assembly test sample (DUT) |
| 13 | 6 Test condition 7 Test methods 7.1 Frequency-domain method 7.1.1 Test theory Figure 2 – Illustration of signal transmission and reflection in DUT Figure 3 – S-parameter representing transmission and reflection characteristics |
| 14 | 7.1.2 Test equipment 7.1.3 Test procedure Figure 4 – System calibration outline Figure 5 – Outline of system calibration and verification when standard test adapter is used |
| 15 | 7.2 Time-domain method 7.2.1 Test theory Figure 6 – DUT test outline Figure 7 – Standard test adaptor calibration and verification outline Figure 8 – DUT test arrangement example |
| 16 | 7.2.2 Equipment 7.2.3 Test procedure Figure 9 – Principle of time-domain measurement |
| 17 | 7.3 Gating 7.3.1 Test principle 7.3.2 Equipment 7.3.3 Test procedure Figure 10 – The position of DUT in the system |
| 18 | 8 Failure criterion 9 Information to be given in the relevant specification 10 Test report |
