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BS EN IEC 62391-1:2022:2023 Edition

BS EN IEC 62391-1:2022:2023 Edition

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Fixed electric double-layer capacitors for use in electric and electronic equipment – Generic specification

Published By Publication Date Number of Pages
BSI 2023 72
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IEC 62391-1:2022 applies to fixed electric double-layer capacitors (hereafter referred to as capacitors) mainly used in DC circuits of electric and electronic equipment. This part of IEC 62391 establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose. This edition includes the following significant technical changes with respect to the previous edition:

  1. The document has been completely restructured to comply with the ISO/IEC Directives, Part 2; a new technical categorization of test methods has been introduced and the test methods have been reorganized according to these new categories; tables, figures and references have been revised accordingly.
  2. Calculation formula of charging/discharging efficiency in Annex D were divided into two cases: “Calculation assuming full charge and discharge” and “Calculation assuming incomplete charging and discharging due to internal resistance”.

PDF Catalog

PDF Pages PDF Title
2 undefined
7 Annex ZA (normative)Normative references to international publicationswith their corresponding European publications
10 Blank Page
11 English
CONTENTS
16 FOREWORD
18 1 Scope
2 Normative references
19 3 Terms and definitions
24 4 General requirements
4.1 Unit and symbols
4.2 Preferred values and class
4.2.1 General
4.2.2 Preferred values of nominal capacitance
4.2.3 Class
4.3 Marking
4.3.1 General
4.3.2 Coding
25 5 General provisions for tests and measurement procedures
5.1 General
5.2 Test and measurement requirements
5.2.1 Test conditions
5.2.2 Measurement conditions
5.2.3 Voltage treatment
5.2.4 Thermal treatment
5.3 Drying
26 5.4 Storage
5.4.1 Storage at high temperature
5.4.2 Storage at low temperature
6 Electrical tests and measurements
6.1 Measurement method 1 for capacitance and internal resistance (constant current discharge)
6.1.1 Basic circuit for measuring
27 6.1.2 Measuring equipment
Figures
Figure 1 − Basic circuit for measuring
28 6.1.3 Measurement procedure
Figure 2 – Voltage–time characteristics between capacitor terminalsin capacitance and internal resistance measurement
29 Tables
Table 1 – Measurement conditions for measurement method 1A
30 6.1.4 Calculation methods for capacitance
Table 2 – Measurement conditions for measurement method 1B
31 6.1.5 Calculation methods for internal resistance
32 6.1.6 Conditions to be prescribed in the detail specification
6.2 Measurement method 2 for capacitance and internal resistance
6.2.1 Constant resistance charging method for capacitance measurement
Figure 3 − Circuit for constant resistance charging method
33 6.2.2 AC internal resistance measurement method
6.3 Leakage current
6.3.1 Measurement method
Figure 4 − Circuit for AC resistance method
34 Figure 5 – Circuit for measuring leakage currents
35 6.3.2 Items to be specified in the detail specification
6.4 Maintain voltage
6.4.1 Measurement method
Figure 6 − Diagram of current and voltage changes at the timeof measuring the leakage current
36 6.4.2 Calculation of voltage maintenance rate
6.4.3 Conditions to be stated in the detail specification
7 Mechanical tests and measurements
7.1 Visual examination and check of dimensions
7.1.1 Visual examination
7.1.2 Dimensions (gauging)
Figure 7 − Maintain voltage test diagram
37 7.1.3 Dimensions (detail)
7.2 Robustness of terminations
7.2.1 Test Ua1 – Tensile
7.2.2 Test Ub – Bending (half of the sample)
7.2.3 Test Uc – Torsion (remaining sample)
7.2.4 Test Ud – Torque (for terminations with threaded studs or screws and for integral mounting devices)
Table 3 – Tensile force
38 7.2.5 Visual examination
7.3 Vibration
7.3.1 Initial measurement
7.3.2 Test
7.3.3 Final measurement and requirements
8 Environmental and climatic tests
8.1 Rapid change of temperature
8.1.1 Initial measurement
8.1.2 Test
8.1.3 Final inspection, measurements and requirements
Table 4 – Torque
39 8.2 Damp heat, steady state
8.2.1 Initial measurement
8.2.2 Test
8.2.3 Final measurement
8.3 Endurance
8.3.1 Initial measurements
8.3.2 Test
8.3.3 Final measurement, inspection and requirements
40 8.4 Characteristics at high and low temperature
8.4.1 General
8.4.2 Test procedure
8.4.3 Dry heat
8.4.4 Cold
8.4.5 Final measurement and requirements
9 Tests related to component assembly
9.1 Resistance to soldering heat
9.1.1 Preconditioning and initial measurement
9.1.2 Test
41 9.1.3 Recovery
9.1.4 Final inspection, measurements and requirements
9.2 Solderability
9.2.1 General
9.2.2 Preconditioning
9.2.3 Capacitors with leads
42 9.2.4 Surface mount capacitors
9.3 Component solvent resistance
9.3.1 Initial measurements
9.3.2 Test
9.3.3 Requirements
43 9.4 Solvent resistance of marking
9.4.1 Test
9.4.2 Requirements
10 Tests related to safety
10.1 Passive flammability
10.1.1 Test procedure
10.1.2 Requirements
44 10.2 Pressure relief (if applicable)
10.2.1 Test
10.2.2 Requirements
11 Quality assessment procedures
Table 5 – Severities and requirements
45 Annex A (normative)Classification according to capacitance and internal resistance
A.1 General
A.2 Classification by capacitance and internal resistance
46 Figure A.1 – Conceptual rendering orientated by characteristics in each classification
Table A.1 – Electrical performance and measurement method by class
47 Annex B (informative)Measurement method of capacitance and low resistanceby low frequency AC method (reference)
B.1 General
B.2 Measurement system
B.3 Calculation of capacitance
Figure B.1 – Capacitance measurement system by the low frequency AC method
48 B.4 Measurement conditions
49 Annex C (informative)Thermal equilibrium time of capacitors
C.1 General
C.2 Thermal equilibrium time of capacitors
Figure C.1 – Thermal equilibrium times of capacitors (from 85 °C to 25 °C)
50 Figure C.2 – Thermal equilibrium times of capacitors (from −40 °C to 25 °C)
Figure C.3 – Capacitor core temperature change with respect to time
51 Annex D (informative)Charging/discharging efficiency and measurement current
D.1 General
D.2 Charging efficiency, discharging efficiency, and current
D.2.1 Calculation assuming full charge and discharge
52 D.2.2 Calculation assuming incomplete charging and discharging due to internal resistance
55 Annex E (informative)Procedures for setting the measurement current of capacitorwith uncertain nominal internal resistance
E.1 General
E.2 Current setting procedures for measurement of capacitor
E.3 Example of a current setting procedure and parameters
Table E.1 – Example of setting current for measurement of capacitor
56 Annex F (informative)Policy on uncertainty of measurement and inset limits
F.1 Objective
F.2 Calculation of measurement uncertainty
F.3 Policy
F.4 Calculation of inset and outset limits
57 F.5 Examples
F.5.1 General
F.5.2 Example 1: Resistor measurement
F.5.3 Example 2: Resistor measurement
F.5.4 Example 3: Transistor measurement (gain)
F.5.5 Example 4: Comparison between initial and final measurement results
58 Annex Q (normative)Quality assessment procedures
Q.1 General
Q.1.1 Overview
Q.1.2 Applicability of qualification approval
Q.1.3 Applicability of capability approval
59 Q.1.4 Applicability of technology approval
Q.2 Primary stage of manufacture
Q.3 Subcontracting
Q.4 Structurally similar components
Q.5 Qualification approval procedures
Q.5.1 Eligibility for qualification approval
60 Q.5.2 Application for qualification approval
Q.5.3 Test procedure for qualification approval
Q.5.4 Granting of qualification approval
Q.5.5 Maintenance of qualification approval
Q.5.6 Quality conformance inspection
Q.6 Capability approval procedures
Q.6.1 General
61 Q.6.2 Eligibility for capability approval
Q.6.3 Application for capability approval
Q.6.4 Description of capability
Figure Q.1 – General scheme for capability approval
62 Q.6.5 Demonstration and verification of capability
Q.6.6 Programme for capability approval
63 Q.6.7 Capability approval test report
Q.6.8 Abstract of description of capability
Q.6.9 Modifications likely to affect the capability approval
Q.6.10 Initial capability approval
64 Q.6.11 Granting of capability approval
Q.6.12 Maintenance of capability approval
65 Q.6.13 Extension of capability approval
Q.6.14 Quality conformance inspection
Q.7 Rework and repair
Q.7.1 Rework
66 Q.7.2 Repair
Q.8 Release for delivery
Q.8.1 General
Q.8.2 Release for delivery under qualification approval before the completion of group B tests
Q.9 Certified test records of released lots
Q.10 Delayed delivery
Q.11 Alternative test methods
Q.12 Manufacture outside the geographical limits of IECQ CBs
Q.13 Unchecked parameters
67 Q.14 Technology approval procedures
Q.14.1 General
Q.14.2 Eligibility for technology approval
Q.14.3 Application of technology approval
Q.14.4 Description of technology
Q.14.5 Demonstration and verification of the technology
Q.14.6 Granting of technology approval
Q.14.7 Maintenance of technology approval
Q.14.8 Quality conformance inspection
68 Q.14.9 Failure rate level determination
Q.14.10 Outgoing quality level
69 Annex X (informative)Cross-references to IEC 62391-1:2015
Table X.1 – Cross-references to the previous edition
70 Bibliography

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