BS EN IEC 62969-4:2018
$142.49
Semiconductor devices. Semiconductor interface for automotive vehicles – Evaluation method of data interface for automotive vehicle sensors
| Published By | Publication Date | Number of Pages |
| BSI | 2018 | 24 |
IEC 62969-4:2018 specifies a method of directly fault injection test for automotive semiconductor sensor interface that can be used to support the conformance assurance in the vehicle communications interface.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 2 | undefined |
| 5 | English CONTENTS |
| 6 | FOREWORD |
| 8 | INTRODUCTION |
| 9 | 1 Scope 2 Normative references 3 Terms, definitions and abbreviated terms 3.1 Terms and definitions |
| 10 | 3.2 Abbreviated terms 4 Evaluation and tests 4.1 Evaluation test setup 4.2 Block diagram Figures Figure 1 – The semiconductor-based sensor data interface test with fault injection |
| 11 | 4.3 Input and output connector setup 4.4 Test conditions and configurations Figure 2 – Block diagram of the data interface example of duplex channel |
| 12 | 4.5 Disturbances test conditions |
| 13 | 5 Disturbance test item 5.1 Data interface load 5.1.1 Variable impedance Figure 3 – Fault injection test configuration example of the sensor data interface |
| 14 | 5.1.2 Direct crosstalk 5.1.3 Diagonal crosstalk 5.2 Data interface line status 5.2.1 Short circuit |
| 15 | 5.2.2 Data interface break 5.3 Fault injection 5.3.1 Disturbing signals |
| 16 | Figure 4 – Disturbing signal put onto the data interface |
| 17 | 5.3.2 Overwrite signals Figure 5 – The node receives invalid signals |
| 18 | 5.3.3 Signal generator 5.3.4 Trigger |
| 20 | Annex A (informative)Description of disturbance detail items |
| 22 | Bibliography |
