BS EN IEC 63251:2023
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Test method for mechanical properties of flexible opto-electric circuit boards under thermal stress
Published By | Publication Date | Number of Pages |
BSI | 2023 | 26 |
This International Standard defines the thermal endurance test methods for reliability assessment of flexible opto-electric circuit boards. The purpose of this standard is to accommodate the uniform thermal characteristics required by the flexible opto-electric circuit in high temperature environments such as automobiles. In particular, this standard specifies a test method to inspect the occurrence of color exchange, deformation and delamination of flexible opto-electric circuit boards under thermal stress.
PDF Catalog
PDF Pages | PDF Title |
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2 | undefined |
5 | Annex ZA (normative)Normative references to international publicationswith their corresponding European publications |
6 | English CONTENTS |
8 | FOREWORD |
10 | 1 Scope 2 Normative references 3 Terms and definitions |
11 | 4 Test method 4.1 General 4.2 Test sample Figures Figure 1 – Schematic diagram of FOECB (top view) |
12 | 4.3 Test process 4.3.1 General description of the test Figure 2 – Schematic diagrams of the FOECB test samples of fibre type Figure 3 – Schematic diagram of the FOECB test samples of fibre type |
13 | 4.3.2 Preconditioning 4.3.3 Test 4.3.4 Recovery Table 1 – Thermal endurance test class for FOECB |
14 | 4.3.5 Final measurements 5 Report |
15 | Annex A (informative)Example of optical bending loss test resultswith general glass optic fibres Figure A.1 – Bending loss test setup Figure A.2 – Optical loss versus bending diameter |
16 | Annex B (informative)Example of preparation method of O-E circuit test samples(optic fibre type) B.1 General B.2 Manufacturing processes of the FOECBs with optic fibres (POF, GOF) Figure B.1 – Arrayed structure of the FOECB test samples formed on one sheet |
17 | B.3 Manufacturing processes of the FOECBs with optical polymer waveguides Figure B.2 – Fabrication of the optic circuits with optic fibres Figure B.3 – Fabrication of the optic circuits with optic polymerwaveguide via the photo-etching method |
18 | B.4 Characteristics of the optic fibres |
19 | Annex C (informative)Example of reflow assembly simulation test results C.1 General C.2 Results of reflow assembly simulation test for a LED chip mounted FOECB with GOF Figure C.1 – LED chip mounted FOECB Figure C.2 – Appearance of a LED chip mounted FOECB afterthe reflow assembly simulation test |
20 | C.3 Results of reflow assembly simulation test for a transparent FOECB with GOF for display applications C.4 Results of reflow assembly simulation test for a polyimide (PI) based FOECB with GOF Figure C.3 – Appearance of a transparent FOECB with GOFs afterthe reflow assembly simulation test Figure C.4 – Appearance of a PI based FOECB with GOF afterthe reflow assembly simulation test |
21 | C.5 Results of reflow assembly simulation test for a polymer-based FOECB Figure C.5 – Appearance of a polymer-based FOECB afterthe reflow assembly simulation test |
22 | Annex D (informative)Example of thermal shock endurance test results D.1 General D.2 Results of thermal shock endurance test for an FOECB with GOF Figure D.1 – Appearance of an FOECB with GOF after the thermal shock test |
23 | Annex E (informative)Example of humidity storage test results E.1 General E.2 Results of humidity storage test for an FOECB with GOF E.3 Results of humidity storage test for an FOECB with POF Figure E.1 – Appearance of an FOECB with GOF after the humidity storage test |
24 | Figure E.2 – Appearance of an FOECB with POF after the humidity storage test |
25 | Bibliography |