BS IEC 60747-14-1:2010

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Semiconductor devices – Semiconductor sensors. Generic specification for sensors

Published By	Publication Date	Number of Pages
BSI	2010	26

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Categories: 31.080.01 - Semiconductor devices in general, BSI

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Description

This part of IEC 60147-14 describes general items concerning the specifications for sensors, which are the basis for specifications given in other parts of this series for various types of sensors. Sensors described in this standard are basically made of semiconductor materials, however, the statements made in this standard are also applicable to sensors using materials other than semiconductor, for example dielectric and ferroelectric materials.

Additional information

Status	Definitive
Pages	26
Publication Date	2010-04-30
ISBN	978 0 580 62900 6
Standard Number	BS IEC 60747-14-1:2010
Title	Semiconductor devices – Semiconductor sensors. Generic specification for sensors
Identical National Standard Of	IEC 60747-14-1:2010
Replaces	BS IEC 60747-14-1:2000
Descriptors	Inspection, Integrated circuits, Electronic equipment and components, Dielectric materials, Probes, Quality assurance, Testing conditions, Ferroelectric materials, Semiconductor devices, Specification (approval), Qualification approval, Semiconductors
Publisher	BSI
Committee	EPL/47
ICS Codes	31.080.01 - Semiconductor devices in general

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BS IEC 60747-14-1:2010

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