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BS IEC 62529:2012

$215.11

IEEE standard for signal and test definition

Published By Publication Date Number of Pages
BSI 2012 340
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This standard provides the means to define and describe signals used in testing. It provides a set of common basic signal definitions, built upon formal mathematical specifications, so that signals can be combined to form complex signals usable across all test platforms. The standard provides support for structural te xtual languages and programming language interfaces for interoperability .

PDF Catalog

PDF Pages PDF Title
4 CONTENTS
7 FOREWORD
13 1. Overview
1.1 Scope
1.2 Purpose
1.3 Application
14 1.4 Annexes
2. Definitions, abbreviations, and acronyms
2.1 Definitions
16 2.2 Abbreviations and acronyms
17 3. Structure of this standard
3.1 Layers
18 3.2 Signal Modeling Language (SML) layer
3.3 BSC layer
3.4 TSF layer
3.5 Test requirement layer
19 3.6 Using the layers
4. Signals and SignalFunctions
4.1 Introduction
20 4.2 Physical signal states
21 4.3 Event states
4.4 Digital stream states
22 5. SML layer
23 6. BSC layer
6.1 BSC layer base classes
6.2 General description of BSCs
24 6.3 SignalFunction template
7. TSF layer
25 7.1 TSF classes
7.2 TSF signals defined by a model
28 7.3 TSF signals defined by an external reference
8. Test procedure language (TPL)
8.1 Goals of the TPL
8.2 Elements of the TPL
29 8.3 Use of the TPL
9. Maximizing test platform independence
30 Annex A (normative) Signal modeling language (SML)
A.1 Use of the SML
A.2 Introduction
31 A.3 Physical types
34 A.4 Signal definitions
36 A.5 Pure signals
38 A.6 Pure signal-combining mechanisms
44 A.7 Pure function transformations
A.8 Measuring, limiting, and sampling signals
46 A.9 Digital signals
50 A.10 Basic component SML
75 A.11 Fast Fourier analysis support
77 Annex B (normative) Basic signal components (BSC) layer
B.1 BSC layer base classes
B.2 BSC subclasses
81 B.3 Description of a BSC
88 B.4 Physical class
99 B.5 PulseDefns class
101 B.6 SignalFunction class
155 Annex C (normative) Dynamic signal descriptions
C.1 Introduction
156 C.2 Basic classes
164 C.3 Dynamic signal goals and use cases
165 Annex D (normative) Interface definition language (IDL) basic components
D.1 Introduction
D.2 IDL BSC library
166 Annex E (informative) Test signal framework (TSF) for C/ATLAS
E.1 Introduction
E.2 TSF library definition in extensible markup language (XML)
E.3 Interface definition language (IDL) for the TSF for C/ATLAS
167 E.4 AC_SIGNAL
169 E.5 AM_SIGNAL
171 E.6 DC_SIGNAL
173 E.7 DIGITAL_PARALLEL
175 E.8 DIGITAL_SERIAL
177 E.9 DIGITAL_TEST
180 E.10 DME_INTERROGATION
183 E.11 DME_RESPONSE
186 E.12 FM_SIGNAL
189 E.13 ILS_GLIDE_SLOPE
192 E.14 ILS_LOCALIZER
195 E.15 ILS_MARKER
198 E.16 PM_SIGNAL
200 E.17 PULSED_AC_SIGNAL
202 E.18 PULSED_AC_TRAIN
204 E.19 PULSED_DC_SIGNAL
206 E.20 PULSED_DC_TRAIN
208 E.21 RADAR_RX_SIGNAL
211 E.22 RADAR_TX_SIGNAL
212 E.23 RAMP_SIGNAL
214 E.24 RANDOM_NOISE
216 E.25 RESOLVER
219 E.26 RS_232
220 E.27 SQUARE_WAVE
222 E.28 SSR_INTERROGATION
225 E.29 SSR_RESPONSE
229 E.30 STEP_SIGNAL
231 E.31 SUP_CAR_SIGNAL
233 E.32 SYNCHRO
237 E.33 TACAN
241 E.34 TRIANGULAR_WAVE_SIGNAL
243 E.35 VOR
247 Annex F (informative) Test signal framework (TSF) library for digital pulse classes
F.1 Introduction
F.2 TSF library definition in extensible markup language (XML)
F.3 Graphical models of TSFs
F.4 Pulse class family of TSFs
264 F.5 DTIF
266 Annex G (normative) Carrier language requirements
G.1 Carrier language requirements
G.2 Interface definition language (IDL)
G.3 Datatypes
271 G.4 Data-processing requirements
275 G.5 Control structures
277 Annex H (normative) Test procedure language (TPL)
H.1 TPL layer
H.2 Elements of the TPL
H.3 Structure of test requirements
H.4 Carrier language
H.5 Signal statements
279 H.6 Mapping of test statements to carrier language
H.7 Test statement definitions
297 H.8 Elements used in test statement definitions
300 H.9 Attributes with multiple properties
304 H.10 Transferring data in digital signals
308 H.11 Creating test requirements
310 H.12 Delimiting TPL statements
312 Annex I (normative) Extensible markup language (XML) signal descriptions
I.1 Introduction
313 I.2 XSD for BSCs
314 I.3 XSD for TSFs
320 Annex J (informative) Support for ATLAS nouns and modifiers
J.1 Signal and test definition (STD) support for ATLAS signals
J.2 STD support for ATLAS nouns
323 J.3 STD support for C/ATLAS noun modifiers
331 J.4 Support for C/ATLAS extensions
332 Annex K (informative) Guide for maximizing test platform independence and test application interchangeability
K.1 Introduction
K.2 Guiding principles
K.3 Best practice rules
335 Annex L (informative) Bibliography
337 Annex M (informative) IEEE List of Participants
BS IEC 62529:2012
$215.11