BS IEC 63003:2015:2016 Edition
$215.11
Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505TM
Published By | Publication Date | Number of Pages |
BSI | 2016 | 174 |
The scope of this standard is the definition of a pin map utilizing the IEEE 1505™ 1 receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace automatic test equipment (ATE) testing applications.