BS IEC/IEEE 62209-1528:2020
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Measurement procedure for the assessment of specific absorption rate of human exposure to radio frequency fields from hand-held and body-mounted wireless communication devices – Human models, instrumentation, and procedures (Frequency range of 4 MHz to 10 GHz)
Published By | Publication Date | Number of Pages |
BSI | 2020 | 284 |
IEC/IEEE 62209-1528:2020 specifies protocols and test procedures for the reproducible and repeatable measurement of the conservative exposure peak spatial average SAR (psSAR) induced inside a simplified model of the head and the body by radio-frequency (RF) transmitting devices, with a defined measurement uncertainty. These protocols and procedures apply to a significant majority of the population, including children, during the use of hand-held and body-worn wireless communication devices. These devices include single or multiple transmitters or antennas, and are operated with their radiating structure(s) at distances up to 200 mm from a human head or body. This document is employed to evaluate SAR compliance of different types of wireless communication devices used next to the ear, in front of the face, mounted on the body, operating in conjunction with other RF-transmitting, non-transmitting devices or accessories (e.g. belt-clips), or embedded in garments. The applicable frequency range is from 4 MHz to 10 GHz. Devices operating in the applicable frequency range can be tested using the phantoms and other requirements defined in this document. The device categories covered include, but are not limited to, mobile telephones, cordless microphones, and radio transmitters in personal, desktop and laptop computers, for multi band operations using single or multiple antennas, including push-to-talk devices. This document can also be applied for wireless power transfer devices operating above 4 MHz. This document does not apply to implanted medical devices. This first edition of IEC/IEEE 62209-1528 cancels and replaces IEC 62209-1:2016, IEC 62209-2:2010, IEC 62209 2:2010/AMD1:2019 and IEEE Std 1528:2013. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) extension of the frequency range down to 4 MHz and up to 10 GHz; b) testing of devices with proximity sensors; c) application specific phantoms; d) device holder specifications; e) fast SAR testing procedures; f) test reduction procedures; g) LTE assessment procedure; h) revision of validation clause, including validation antennas; i) revision of SAR assessment procedure; j) time-average SAR measurement procedure; k) uncertainty analysis; This publication is published as an IEC/IEEE Dual Logo standard.
PDF Catalog
PDF Pages | PDF Title |
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2 | undefined |
4 | CONTENTS |
16 | FOREWORD |
19 | INTRODUCTION |
20 | 1 Scope 2 Normative references 3 Terms and definitions |
28 | 4 Symbols and abbreviated terms 4.1 Physical quantities 4.2 Constants |
29 | 4.3 Abbreviated terms |
30 | 5 Quick start guide and evaluation plan checklist Tables Table 1 โ Evaluation plan checklist |
31 | Figures Figure 1 โ Quick start guide |
32 | 6 Measurement system specifications 6.1 General requirements for full SAR testing |
33 | 6.2 Phantom specifications 6.2.1 General 6.2.2 Basic phantom parameters |
34 | Table 2 โ Dielectric properties of the tissue-equivalent medium |
35 | 6.2.3 Head phantom |
36 | 6.2.4 Flat phantom |
37 | 6.2.5 Device-specific phantoms 6.3 Influence of hand on SAR in head Figure 2 โ Dimensions of the elliptical phantom |
38 | 6.4 Scanning system requirements 6.5 Device holder specifications |
39 | 6.6 Characteristics of the readout electronics 7 Protocol for SAR assessment 7.1 General 7.2 Measurement preparation 7.2.1 Preparation of tissue-equivalent medium and system check Figure 3 โ Mounting of the DUT in the device holder using low-permittivity andlow-loss foam to avoid changes of DUT performance by the holder material |
40 | 7.2.2 Preparation of the wireless communication DUT 7.2.3 DUT operating mode requirements |
42 | 7.2.4 Positioning of the DUT relative to the phantom |
43 | Figure 4 โ Designation of DUT reference points |
44 | Figure 5 โ Measurements performed by shifting a large deviceover the efficient measurement area of the system includingoverlapping areas โ in this case: six tests performed |
45 | Figure 6 โ Test positions for body-worn devices |
46 | Figure 7 โ Device with swivel antenna |
47 | Figure 8 โ Test positions for body supported devices |
49 | Figure 9 โ Test positions for desktop devices |
50 | Figure 10 โ Test positions for front-of-face devices |
51 | Figure 11 โ Test position for hand-held devices, not used at the head or torso Figure 12 โ Test position for limb-worn devices |
52 | Figure 13 โ Test position for clothing-integrated wireless communication devices |
53 | Figure 14 โ Possible test positions for a generic device |
55 | Figure 15 โ Vertical and horizontal reference lines and referencepoints A and B on two example device types: a full touch-screensmart phone (left) and a DUT with a keypad (right) |
58 | Figure 16 โ Cheek position of the DUT on the left side of SAM wherethe device position shall be maintained for the phantom test set-up Figure 17 โ Tilt position of the DUT on the left side of SAM |
59 | 7.2.5 Antenna configurations 7.2.6 Options and accessories 7.2.7 DUTs with alternative form factor Figure 18 โ An alternative form factor DUT with reference points and reference lines |
60 | 7.2.8 Test frequencies for DUTs 7.3 Tests to be performed for DUTs 7.3.1 General |
61 | 7.3.2 Basic approach for DUT testing |
62 | 7.4 Measurement procedure 7.4.1 General 7.4.2 Full SAR testing procedure Figure 19 โ Block diagram of the tests to be performed |
65 | Table 3 โ Area scan parameters Table 4 โ Zoom scan parameters |
66 | 7.4.3 Drift Figure 20 โ Orientation of the probe with respect to the line normal to the phantom surface, for head and flat phantoms, shown at two different locations |
68 | 7.4.4 SAR measurements of DUTs with multiple antennas or multiple transmitters |
72 | Table 5 โ Example method to determine the combined SAR value using Alternative 1 |
74 | 7.5 Post-processing of SAR measurement data 7.5.1 Interpolation 7.5.2 Extrapolation 7.5.3 Definition of the averaging volume Figure 21 โ Measurement procedure for different types of correlated signals |
75 | 7.5.4 Searching for the maxima 7.6 Time-period averaged SAR considerations 7.6.1 General 7.6.2 RF conducted power 7.6.3 Time-period averaged SAR measurement settings for SAR measurement methods |
76 | 7.6.4 Exposure condition and test position considerations 7.6.5 Time-period averaged SAR for simultaneous transmission 7.6.6 TX factor assessment |
77 | 7.6.7 SAR measurements 7.6.8 Uncertainty in TPAS evaluations |
78 | 7.7 Proximity sensors considerations 7.7.1 General |
79 | 7.7.2 Procedures for determining proximity sensor triggering distances |
81 | Figure 22 โ Positioning of the surfaces and edges of the DUTfor determining the proximity sensor triggering distance |
82 | 7.7.3 Procedure for determining proximity sensor coverage area Figure 23 โ Positioning of the edges of the DUT to determineproximity sensor triggering distance variations with the edgepositioned at different angles from the perpendicular position |
83 | 7.7.4 SAR measurement procedure involving proximity sensors 7.8 SAR correction for deviations of complex permittivity from targets 7.8.1 General |
84 | 7.8.2 SAR correction formula |
85 | 7.8.3 Uncertainty of the correction formula 7.9 Minimization of testing time 7.9.1 General Table 6 โ Root-mean-squared error SAR correction formula as afunction of the maximum change in permittivity or conductivity [28] |
86 | 7.9.2 Fast SAR testing |
89 | Figure 24 โ Fast SAR Procedure A |
91 | 7.9.3 SAR test reductions Figure 25 โ Fast SAR Procedure B |
95 | Figure 26 โ Modified chart of Figure 19 Table 7 โ Threshold values TH(f) used in this proposed test reduction protocol |
99 | Figure 27 โ Use of conducted power for LTE mode selection,for Band 1 (1 920 MHz to 1 980 MHz) (MPR values are in dB) |
100 | Figure 28 โ Use of conducted power for LTE modeselection, for Band 17 (704 MHz to 716 MHz) (MPR values are in dB) |
102 | 8 Measurement uncertainty estimation 8.1 General |
103 | 8.2 Requirements on the uncertainty evaluation Table 8 โ Divisors for common probability density functions (PDFs) |
104 | 8.3 Description of uncertainty models 8.3.1 General 8.3.2 SAR measurement of a DUT 8.3.3 System validation and system check measurement 8.3.4 System check repeatability and reproducibility 8.3.5 Fast SAR testing (relative measurement) |
105 | Table 9 โ Uncertainty budget template for evaluating the uncertaintyin the measured value of 1โg or 10โg psSAR from a DUT or validationantenna (N = normal, R = rectangular) |
106 | 8.4 Parameters contributing to uncertainty 8.4.1 Measurement system errors |
107 | 8.4.2 Phantom and device (DUT or validation antenna) errors |
109 | 8.4.3 Corrections to the SAR result (if applied) Table 10 โ Uncertainty of Formula (8) (see 7.8.2) as a function ofthe maximum change in permittivity or conductivity |
110 | 9 Measurement report 9.1 General 9.2 Items to be recorded in the measurement report |
114 | Annexes Annex A (normative)SAR measurement system verification A.1 Overview A.2 System check A.2.1 Purpose |
115 | A.2.2 Phantom set-up A.2.3 System check antenna |
116 | A.2.4 System check antenna input power measurement Figure A.1 โ Test set-up for the system check |
117 | A.2.5 System check procedure |
118 | A.2.6 System check acceptance criteria A.3 System validation A.3.1 Purpose A.3.2 Phantom set-up A.3.3 System validation antennas |
119 | A.3.4 Input power measurement A.3.5 System validation procedure |
121 | A.4 Fast SAR testing system validation and system check A.4.1 General A.4.2 Fast SAR testing system validation |
122 | A.4.3 Fast SAR testing system check |
124 | Annex B (informative)SAR test reduction supporting information B.1 General B.2 Test reduction based on characteristics of DUT design B.2.1 General B.2.2 Statistical analysis overview |
125 | B.2.3 Analysis results Table B.1 โ The number of DUTs used for the statistical study |
126 | Figure B.1 โ Distribution of Tilt/Cheek Table B.2 โ Statistical analysis results ofP(Tilt/Cheek > x) for various x values Table B.3 โ Statistical analysis results ofP(Tilt/Cheek > x) for 1 g and 10 g psSAR |
127 | Table B.4 โ Statistical analysis results ofP(Tilt/Cheek > x) for various antenna locations Table B.5 โ Statistical analysis results ofP(Tilt/Cheek > x) for various frequency bands |
128 | B.2.4 Conclusions B.2.5 Expansion to multi-transmission antennas B.3 Test reduction based on analysis of SAR results on other signal modulations B.3.1 General Table B.6 โ Statistical analysis results ofP(Tilt/Cheek > x) for various device types |
129 | B.3.2 Analysis results |
130 | B.4 Test reduction based on SAR level analysis B.4.1 General Figure B.2 โ SAR relative to SAR in position with maximum SAR in GSM mode |
131 | B.4.2 Statistical analysis |
132 | Figure B.3 โ Two points identifying the minimum distance between theposition of the interpolated maximum SAR and the points at 0,6 ร SARmax Figure B.4 โ Histogram for Dmin in the case of GSM 900 and iso-level at 0,6 ร SARmax Table B.7 โ Distance for various โiso-levelโ values |
134 | B.4.3 Test reduction applicability example Figure B.5 โ Histogram for random variable Factor1g,1800 Table B.8 โ Experimental thresholds to have a 95 % probability that themaximum measured SAR value from the area scan will also have a psSAR |
135 | Table B.9 โ SAR values from the area scan (GSM 900 band): Example 1 Table B.10 โ SAR values from the area scan (GSM 900 band): Example 2 |
136 | B.5 Other statistical approaches to search for the high SAR test configurations B.5.1 General B.5.2 Test reductions based on a DOE B.5.3 One factor at a time (OFAT) search B.5.4 Analysis of unstructured data |
137 | Annex C (informative)Measurement uncertainty of results obtained fromspecific fast SAR testing methods C.1 General C.2 Measurement uncertainty evaluation โ contributing parameters C.2.1 General |
138 | C.2.2 Probe calibration and system calibration drift C.2.3 Isotropy |
139 | C.2.4 Probe positioning |
140 | C.2.5 Mutual sensor coupling |
141 | C.2.6 Scattering within the probe array C.2.7 Sampling error C.2.8 Array boundaries C.2.9 Probe or probe array coupling with the DUT C.2.10 Measurement system immunity / secondary reception |
142 | C.2.11 Deviations in phantom shape C.2.12 Spatial variation in dielectric properties C.2.13 Reconstruction C.3 Uncertainty budget |
143 | Table C.1 โ Measurement uncertainty budget for relativeSAR measurements using Class 2 fast SAR testing,for tests performed within one frequency band and modulation |
144 | Table C.2 โ Measurement uncertainty budget forsystem check using Class 2 fast SAR testing |
145 | Annex D (normative)SAR system validation antennas D.1 General antenna requirements D.2 Standard dipole antenna D.2.1 Mechanical description |
147 | Figure D.1 โ Mechanical details of the standard dipoles |
148 | D.2.2 Numerical target SAR values Table D.1 โ Mechanical dimensions of the reference dipoles |
149 | Table D.2 โ Numerical target SAR values (W/kg) for standard dipole and flat phantom |
150 | D.3 Standard waveguide D.3.1 Mechanical description Figure D.2 โ Standard waveguide (dimensions are according to Table D.3) Table D.3 โ Mechanical dimensions of the standard waveguide |
151 | D.3.2 Numerical target SAR values D.4 System validation antennas for below 150 MHz D.4.1 General Table D.4 โ Numerical target SAR values for waveguides |
152 | D.4.2 Confined loop antenna Figure D.3 โ Drawing of the CLA that corresponds to a resonant loop integratedin a metallic structure to isolate the resonant structure from the environment |
153 | Table D.5 โ Numerical target SAR values for CLAs |
154 | D.4.3 Meander dipole antenna Figure D.4 โ Mechanical details of the meander dipoles for 150 MHz Table D.6 โ Mechanical dimensions of the reference meander dipole |
155 | D.5 Orthogonal E-field source โ VPIFA D.5.1 Mechanical description Table D.7 โ Numerical target SAR value (W/kg) for meander dipole |
156 | Table D.8 โ Dimensions for VPIFA antennas at different frequencies |
157 | Figure D.5 โ VPIFA validation antenna Figure D.6 โ Mask for positioning VPIFAs Table D.9 โ Electric properties for the dielectric layers for VPIFA antennas |
158 | D.5.2 Numerical target SAR values Table D.10 โ Numerical target SAR values for VPIFAs on the flat phantom |
159 | Annex E (normative)Calibration and characterization of dosimetric (SAR) probes E.1 Introductory remarks |
160 | E.2 Linearity E.3 Assessment of the sensitivity of the dipole sensors E.3.1 General E.3.2 Two-step calibration procedures |
162 | Table E.1 โ Uncertainty analysis for transfer calibration using temperature probes |
164 | Figure E.1 โ Experimental set-up for assessment of the sensitivity(conversion factor) using a vertically-oriented rectangular waveguide |
165 | Table E.2 โ Guidelines for designing calibration waveguides |
166 | E.3.3 One-step calibration procedure โ reference antenna method Table E.3 โ Uncertainty analysis of the probe calibration in waveguide |
167 | Figure E.2 โ Illustration of the antenna gain evaluation set-up |
168 | Table E.4 โ Uncertainty template for evaluation of reference antenna gain |
169 | Table E.5 โ Uncertainty template for calibration using reference antenna |
170 | E.3.4 One-step calibration procedure โ coaxial calorimeter method |
171 | Figure E.3 โ Schematic of the coaxial calorimeter system |
172 | E.4 Isotropy E.4.1 Axial isotropy E.4.2 Hemispherical isotropy Table E.6 โ Uncertainty components for probe calibration using thermal methods |
173 | Figure E.4 โ Set-up to assess hemisphericalisotropy deviation in tissue-equivalent medium |
174 | Figure E.5 โ Alternative set-up to assess hemisphericalisotropy deviation in tissue-equivalent medium |
175 | Figure E.6 โ Experimental set-up for thehemispherical isotropy assessment |
176 | Figure E.7 โ Conventions for dipole position (ฮพ) and polarization (ฮธ) |
177 | E.5 Lower detection limit Figure E.8 โ Measurement of hemispherical isotropy with reference antenna |
178 | E.6 Boundary effect E.7 Response time |
179 | Annex F (informative)Example recipes for phantom tissue-equivalent media F.1 General F.2 Ingredients |
180 | F.3 Tissue-equivalent medium liquid formulas (permittivity/conductivity) Table F.1 โ Suggested recipes for achievingtarget dielectric properties, 30 MHz to 900 MHz |
181 | Table F.2 โ Suggested recipes for achieving targetdielectric properties, 1 800 MHz to 10 000 MHz |
182 | Annex G (normative)Phantom specifications G.1 Rationale for the phantom characteristics G.1.1 General G.1.2 Rationale for the SAM phantom G.1.3 Rationale for the flat phantom |
183 | G.2 SAM phantom specifications G.2.1 General SAM phantom specifications |
184 | Figure G.1 โ Illustration of dimensions in Table G.1 and Table G.2 |
185 | Table G.1 โ Dimensions used in deriving SAM phantom fromthe ARMY 90th percentile male head data (Gordon et al. [61]) Table G.2 โ Additional SAM dimensions compared with selecteddimensions from the ARMY 90th percentile male head data(Gordon et al. [61])โspecialist head measurement section |
186 | Figure G.2 โ Close up side view of phantom showing the ear region |
187 | G.2.2 SAM phantom shell specification Figure G.3 โ Side view of the phantom showing relevant markings |
188 | Figure G.4 โ Sagittally bisected phantom with extended perimeter(shown placed on its side as used for device SAR tests) Figure G.5 โ Picture of the phantom showing the central strip |
189 | G.3 Flat phantom specifications Figure G.6 โ Cross-sectional view of SAM at the reference plane |
190 | G.4 Justification of flat phantom dimensions |
191 | Figure G.7 โ Dimensions of the flat phantom set-up used for deriving theminimal phantom dimensions for W and L for a given phantom depth D |
192 | Figure G.8 โ FDTD predicted error in the 10 g psSAR as a function of the dimensions of the flat phantom compared with an infinite flat phantom at 800 MHz Table G.3 โ Parameters used for calculation of reference SAR values in Table D.2 |
193 | G.5 Rationale for tissue-equivalent media |
195 | G.6 Definition of a phantom coordinate system and a DUT coordinate system Figure G.9 โ Complex permittivity of human tissuescompared to the phantom target properties |
196 | Figure G.10 โ Example reference coordinate systemfor the left-ear ERP of the SAM phantom Figure G.11 โ Example coordinate system on a DUT |
197 | Annex H (informative)Measurement of the dielectric properties of tissue-equivalent media and uncertainty estimation H.1 Overview H.2 Measurement techniques H.2.1 General H.2.2 Instrumentation H.2.3 General principles |
198 | H.3 Slotted coaxial transmission line H.3.1 General H.3.2 Equipment set-up Figure H.1 โ Slotted line set-up |
199 | H.3.3 Measurement procedure H.4 Contact coaxial probe H.4.1 General |
200 | H.4.2 Equipment set-up Figure H.2 โ An open-ended coaxial probe with inner and outer radii a and b, respectively |
201 | H.4.3 Measurement procedure H.5 TEM transmission line H.5.1 General |
202 | H.5.2 Equipment set-up H.5.3 Measurement procedure Figure H.3 โ TEM line dielectric properties test set-up [85] |
203 | H.6 Dielectric properties of reference liquids |
204 | Table H.1 โ Parameters for calculating thedielectric properties of various reference liquids |
205 | Table H.2 โ Dielectric properties of reference liquids at 20 ยฐC |
206 | Annex I (informative)Studies for potential hand effects on head SAR I.1 Overview I.2 Background I.2.1 General |
207 | I.2.2 Hand phantoms I.3 Summary of experimental studies I.3.1 Experimental studies using fully compliant SAR measurement systems I.3.2 Experimental studies using other SAR measurement systems |
208 | I.4 Summary of computational studies I.5 Conclusions |
209 | Annex J (informative)Skin enhancement factor J.1 Background Figure J.1 โ SAR and temperature increase (ฮT) distributionssimulated for a three-layer (skin, fat, muscle) planar torso model |
210 | J.2 Rationale J.3 Simulations |
211 | J.4 Recommendation Figure J.2 โ Statistical approach to protect 90 % of the population Table J.1 โpsSAR correction factors |
212 | Figure J.3 โ psSAR skin enhancement factors |
213 | Annex K (normative)Application-specific phantoms K.1 General K.2 Phantom basic requirements K.3 Examples of specific alternative phantoms K.3.1 Face-down SAM phantom |
214 | K.3.2 Head-stand SAM phantom K.3.3 Wrist phantom Figure K.1 โ SAM face-down phantom Figure K.2 โ SAM head-stand phantom |
215 | K.4 Scanning and evaluation requirements K.5 Uncertainty assessment K.6 Reporting Figure K.3 โ Wrist phantom |
216 | Annex L (normative)Fast compliance evaluations using a flat-bottomphantom with a curved corner (Uniphantom) L.1 General L.2 Uniphantom L.3 Device positions for compliance testing and definitions of handset shapes L.3.1 General Figure L.1 โ Cross section of the unified phantom (Uniphantom) with its dimensions |
217 | L.3.2 Handsets with a straight form factor L.3.3 Handsets with a clamshell form factor L.4 Testing procedure L.4.1 General L.4.2 Handsets with straight form factors Figure L.2 โ Measurement positions of handsets withstraight and clamshell form factors |
218 | L.4.3 Handsets with clamshell form factors Figure L.3 โ Flow chart of testing procedure for handsets with straight form factors |
219 | L.5 Uncertainty of SAR measurement results using Uniphantom |
220 | Annex M (informative)Wired hands-free headset testing M.1 Concept Figure M.1 โ Configuration of a personal wired hands-free headset |
221 | M.2 Example results Figure M.2 โ Configuration without a personal wired hands-free headset |
222 | M.3 Discussion |
223 | Annex N (informative)Applying the head SAR test procedures Table N.1 โ SAR results tables for example test results in GSM 850 band |
224 | Table N.2 โ SAR results tables for example test results in GSM 900 band Table N.3 โ SAR results tables for example test results in GSM 1800 band |
225 | Table N.4 โ SAR results tables for example test results in GSM 1900 band |
226 | Annex O (normative)Uncertainty analysis for measurement systemmanufacturers and calibration laboratories O.1 Probe linearity and detection limits |
227 | O.2 Broadband signal uncertainty O.3 Boundary effect |
228 | O.4 Field-probe readout electronics uncertainty O.5 Signal step-response time uncertainty |
229 | O.6 Probe integration-time uncertainty O.6.1 General O.6.2 Probe integration-time uncertainty for periodic pulsed signals |
230 | O.6.3 Probe integration-time uncertainty for non-periodic signals O.7 Contribution of mechanical constraints O.7.1 Mechanical tolerances of the probe positioner (directions parallel to phantom surface) O.7.2 Probe positioning with respect to phantom shell surface |
231 | O.7.3 First-order approximation of exponential decay O.8 Contribution of post-processing O.8.1 General |
232 | O.8.2 Evaluation test functions |
233 | Table O.1 โ Parameters for the reference function f1 in Formula (O.12) |
234 | O.8.3 Data-processing algorithm uncertainty evaluations Table O.2 โ Reference SAR values from the distribution functions f1, f2, and f3 |
237 | O.9 Tissue-equivalent medium properties uncertainty O.9.1 General O.9.2 Medium density O.9.3 Medium conductivity uncertainty O.9.4 Medium permittivity uncertainty O.9.5 Assessment of dielectric properties measurement uncertainties Figure O.1 โ Orientation and surface of averaging volume relative to phantom surface |
239 | O.9.6 Medium temperature uncertainty Table O.3 โ Example uncertainty template and example numericalvalues for permittivity () and conductivity (ฯ) measurement |
241 | Annex P (normative)Post-processing techniques P.1 Extrapolation and interpolation schemes P.1.1 General P.1.2 Extrapolation schemes P.1.3 Interpolation schemes P.2 Averaging scheme and maximum finding P.2.1 Volume average schemes |
242 | P.2.2 Finding the psSAR and estimating the uncertainty |
243 | Annex Q (informative)Rationale for time-period averaged SAR test procedure |
244 | Annex R (normative)Measurement uncertainty analysis for testing laboratories R.1 RF ambient conditions R.2 Device positioning and holder uncertainties R.2.1 General |
245 | R.2.2 Device holder perturbation uncertainty |
246 | R.2.3 DUT positioning uncertainty with a specific test device holder: Type A R.3 Probe modulation response |
247 | R.4 Time-period averaged SAR R.4.1 General R.4.2 TX factor uncertainty |
248 | R.5 Measured SAR drift R.5.1 General R.5.2 Accounting for drift |
249 | R.6 SAR scaling uncertainty |
250 | Annex S (normative)Validation antenna SAR measurement uncertainty S.1 Deviation of experimental antennas S.2 Other uncertainty contributions when using system validation antennas Table S.1 โ Uncertainties relating to the deviations ofthe parameters of the standard waveguide from theory |
251 | Table S.2 โ Other uncertainty contributions relatingto the dipole antennas specified in Annex D. Table S.3 โ Other uncertainty contributions relating tothe standard waveguides specified in Annex D |
252 | Annex T (normative)Interlaboratory comparisons T.1 Purpose T.2 Phantom set-up T.3 Reference devices T.4 Power set-up |
253 | T.5 Interlaboratory comparison โ procedure |
254 | Annex U (informative)Determination of the margin forcompliance evaluation using the Uniphantom U.1 General U.2 Deviation of the psSAR measured using the Uniphantom from the psSAR measured using the SAM phantom Figure U.1 โ Categories (classes) for comparison of the measured psSAR between the Uniphantom (SARuni) and the SAM phantom (SARSAM) |
255 | U.3 Determination of margin based on 95 % confidence interval U.4 Examples of the determination of the margin factor U.4.1 Margin for handsets with straight form factors at flat-bottom position |
256 | Figure U.2 โ Histogram of the deviation of the 10 g psSAR of 45 handsetswith straight form factors positioned at the flat bottom of the Uniphantom Table U.1 โ Summary of information to determine the margin for handsetswith straight form factors positioned at the flat bottom of the Uniphantom |
257 | U.4.2 Margin for handsets with straight form factors (except smart phones at flat-bottom position) Figure U.3 โ Histogram of the deviation of the 1 g psSAR of 40 handsetswith straight form factors positioned at the flat bottom of the Uniphantom |
258 | Figure U.4 โ Histogram of the deviation of the 10 g psSAR of 25 handsets withstraight form factors positioned at the flat bottom of the Uniphantom Table U.2 โ Summary of information to determine the margin for handsetswith straight form factors, including slide-type and bar handsets (exceptsmart phones), positioned at the flat bottom of the Uniphantom |
259 | U.4.3 Margin for smart phones at flat-bottom position Figure U.5 โ Histogram of the deviation of the 1 g psSAR from 20 handsets withstraight form factors positioned at the flat bottom of the Uniphantom |
260 | Figure U.6 โ Histogram of the deviation of the 10 g psSAR of 20 handsets with straight form factors or smart phones positioned at the flat bottom of the Uniphantom Table U.3 โ Summary of information to determine the margin for thesmart phones positioned at the flat bottom of the Uniphantom |
261 | U.4.4 Margin for smart phones at corner position Figure U.7 โ Histogram of the deviation of the 1 g psSAR of 20 handsets with straight form factors or smart phones positioned at the flat bottom of the Uniphantom |
262 | Figure U.8 โ Histogram of the deviation of the 10 g psSAR of 20 handsets with straight form factors or smart phones positioned at the corner of the Uniphantom Table U.4 โ Summary of information to determine the marginfor smart phones positioned at the corner of the Uniphantom |
263 | U.4.5 Margin for handsets with clamshell form factors at corner position Figure U.9 โ Histogram of the deviation of the 1 g psSAR of 19 handsets with straight form factors or smart phones positioned at the corner of the Uniphantom Table U.5 โ Statistical analysis results of P(Tilt/Cheek > x) for various device types |
264 | Figure U.10 โ Histogram of the deviation of the 10 g psSAR of 20 handsetswith clamshell form factors at the corner of the Uniphantom Table U.6 โ Summary of information to determine the margin for handsets with clamshell form factors positioned at the corner of the Uniphantom |
265 | Figure U.11 โ Histogram of the deviation of the 1 g psSAR of 19 handsetswith clamshell form factors at the corner of the Uniphantom |
266 | Annex V (informative)Automatic input power levelcontrol for system validation V.1 General V.2 Operational mechanism of AIPLC Figure V.1 โ Generated RF input power variations tooperation time without and with application of AIPLC |
267 | Figure V.2 โ The system block diagram of the AIPLC Figure V.3 โ Power variation characteristics byadjusting the amplifier or signal generator outputs |
268 | Annex W (informative)LTE test configurations supporting information W.1 General W.2 Study 1 |
269 | Figure W.1 โ Low, middle, and high channels at 2 GHz band (Band 1) Table W.1 โ Relative standard deviation of ฮฑ found in Study 1 (without MPR) |
270 | W.3 Study 2 Figure W.2 โ RF conducted power versus 10 g psSAR |
271 | W.4 Justifications of relative standard deviations Figure W.3 โ 1 g SAR as a function of RF conducted power in various test conditions Table W.2 โ Maximum relative standard deviation of ฮฑ found in Study 2 (with MPR) |
273 | Bibliography |