BS ISO 11938:2012:2013 Edition
$102.76
Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
| Published By | Publication Date | Number of Pages |
| BSI | 2013 | 22 |
This International Standard provides procedures for electron microprobe elemental-mapping analysis using wavelength-dispersive spectrometry. The choice between mapping with the electron beam moving digitally across the specimen (electron beam mapping) and mapping with stage movement only (large-area mapping) is assessed. It describes five types of data processing: the raw X-ray intensity data method, the k-value method, the calibration method, the correlation method and the matrix correction method.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 6 | Foreword |
| 7 | Introduction |
| 9 | 1 Scope 2 Normative references 3 Terms and definitions |
| 10 | 4 Procedure of mapping analysis 4.1 General 4.2 Specimen preparation |
| 11 | 4.3 Measurement procedure |
| 14 | 5 Methods for displaying element maps 5.1 General 5.2 Raw X‑ray intensity method 5.3 k‑value method 5.4 Calibration curve method |
| 15 | 5.5 Correlation method 5.6 Matrix correction method 6 Evaluation of uncertainty 7 Report |
| 17 | Annex A (normative) Comparison of absorption effects for a light element |
| 18 | Bibliography |
