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BS ISO 18114:2003

$86.31

Surface chemical analysis. Secondary-ion mass spectrometry. Determination of relative sensitivity factors from ion-implanted reference materials

Published By Publication Date Number of Pages
BSI 2003 14
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Status

Withdrawn

Title

Surface chemical analysis. Secondary-ion mass spectrometry. Determination of relative sensitivity factors from ion-implanted reference materials

Publisher

BSI

Committee

CII/60

Pages

14

Publication Date

2003-08-07

Withdrawn Date

2021-05-18

Replaced By

BS ISO 18114:2021

ISBN

0 580 42438 3

Standard Number

BS ISO 18114:2003

Identical National Standard Of

ISO 18114:2003

Descriptors

Homogeneity, Mass spectrometry, Spectroscopy, Chemical composition, Ions, Secondary, Chemical analysis and testing, Test methods, Surface chemistry

ICS Codes 71.040.40 - Chemical analysis
BS ISO 18114:2003
$86.31