BS ISO 19810:2017
$102.76
Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for self-cleaning performance of semiconducting photocatalytic materials under indoor lighting environment. Measurement of water contact angle
| Published By | Publication Date | Number of Pages |
| BSI | 2017 | 20 |
This document specifies a test method for the determination of the self-cleaning performance of sheet-form materials that contain an indoor-light-active photocatalyst or have indoor-light-active photocatalytic films on the surface, under indoor lighting environment.
This method is used to measure the change of water contact angle under indoor lighting environment, which is one of the indices reflecting the self-cleaning performance of semiconducting photocatalytic materials.
This document is not applicable to permeable materials on which water droplets cannot hold and rough materials which obscure water droplets. This document is not applicable to materials of which the changes in the water contact angle due to decomposition of adhered organic matter cannot be evaluated because even if the surface is clean the water contact angle is remarkably large or the water contact angle cannot be sufficiently increased by attaching organic matter to the surface.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 2 | National foreword |
| 6 | Foreword |
| 7 | 1 Scope 2 Normative references 3 Terms and definitions |
| 9 | 4 Principle 5 Test apparatus 5.1 Instruments and apparatus |
| 10 | 5.2 Reagents 5.3 Laboratory temperature and humidity 6 Test piece preparation 7 Test procedures 7.1 Measurement of water contact angle |
| 11 | 7.2 Test piece pretreatment |
| 12 | 7.3 Visible light irradiation and measurement of contact angle after n h of visible light irradiation, θ4(n) 7.3.1 Measurement of illuminance and preparation of test piece placement location |
| 14 | 8 Calculation of test results 8.1 Guide to the rounding of numbers 8.2 Calculation of contact angle |
| 15 | 8.3 Conditions for a valid test 8.4 Initial contact angle halving time, n1/2 8.5 Contact angle reduction time, n10° |
| 16 | 9 Reporting of test results 10 Test measurement examples |
| 18 | Bibliography |
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ISO 19810:2017
Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for self-cleaning performance of semiconducting…
