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BS ISO 21466:2019

$198.66

Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM

Published By Publication Date Number of Pages
BSI 2019 56
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This document specifies the structure model with related parameters, file format and fitting procedure for characterizing critical dimension (CD) values for wafer and photomask by imaging with a critical dimension scanning electron microscope (CD-SEM) by the model-based library (MBL) method. The method is applicable to linewidth determination for specimen, such as, gate on wafer, photomask, single isolated or dense line feature pattern down to size of 10 nm.

PDF Catalog

PDF Pages PDF Title
2 undefined
6 Foreword
7 Introduction
9 1 Scope
2 Normative references
3 Terms and definitions
16 4 Symbols and abbreviated terms
5 Generation of Model-based Library (MBL)
5.1 Basic components of a MBL simulator
5.1.1 Electron probe model
18 5.1.2 SE signal generation model
19 5.1.3 SE signal detection model
20 5.2 Model of specimen
5.2.1 Specimen structure and parameters
23 5.2.2 Specimen specification
5.2.3 Generation methods of specimen geometry
5.3 Monte Carlo simulation
5.3.1 Input parameters
24 5.3.2 Beam-specimen interaction
5.4 MBL file structure
5.4.1 Variable type and value
28 5.4.2 Model description file
29 5.4.3 Parameter specification file
5.4.4 Preparation of library data
30 5.4.5 MBL data structure
5.4.6 MBL data file format
31 6 Acquisition of a CD-SEM image
6.1 Acceptable image
6.2 Specimen tilt
6.3 Image quality
6.4 Selection of the field of view
6.5 CD-SEM image data file
7 CD determination
32 7.1 Determination of pixel size
7.2 Selection of the field of interest
7.3 Coordination and normalization
33 7.4 Matching procedure
7.4.1 Interpolation
7.4.2 Convolution
34 7.4.3 Matching
38 7.4.4 Averaging
39 8 Module functions and relationship
41 9 Uncertainty of CD measurement
43 Annex A (normative) Flow charts of procedures
47 Annex B (informative) Example of model description file
48 Annex C (informative) Example of parameter specification file
49 Annex D (informative) Example of CD evaluation
52 Bibliography
BS ISO 21466:2019
$198.66