BS QC 750100:1986+A2:1996:2010 Edition

$102.76

Harmonized system of quality assessment for electronic components. Discrete semiconductor devices. Sectional specification

Published By	Publication Date	Number of Pages
BSI	2010	22

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Categories: 31.080.01 - Semiconductor devices in general, BSI

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Description

This sectional specification applies to discrete semiconductor devices, excluding opto-electronic devices.

Procedures to be followed with discrete semiconductor devices (excluding optoelectronic devices), the possible group conditions for structurally similar devices, the requirements for quality conformance inspection and the various steps for screening. Also preferred values of voltages and currents, identification of terminals.

Additional information

Status	Definitive
Pages	22
Publication Date	2010-01-31
ISBN	978 0 580 69209 3
Standard Number	BS QC 750100:1986+A2:1996, IEC 60747-11:1985
Title	Harmonized system of quality assessment for electronic components. Discrete semiconductor devices. Sectional specification
Identical National Standard Of	IEC 60747-11:1985/AMD2:1996
Descriptors	Semiconductor devices, Qualification approval, Identification methods, Electrical measurement, Electronic equipment and components, Inspection, Electrical testing, Assessed quality, Quality control, Electric terminals, Specification (approval), Quality assurance systems, Approval testing, Semiconductors, Statistical quality control, Detail specification, Colour codes
Publisher	BSI
Committee	EPL/47
Amends	BS QC 750100:1986
ICS Codes	31.080.01 - Semiconductor devices in general

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BS QC 750100:1986+A2:1996

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BS QC 750100:1986+A2:1996:2010 Edition

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BS QC 750100:1986+A2:1996:2010 Edition