BS QC 750112:1988
$102.76
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Semiconductor devices. Discrete devices. Field-effect transistors. Blank detail specification for single-gate field-effect transistors, up to 5 W and 1 GHz
| Published By | Publication Date | Number of Pages |
| BSI | 1988 | 20 |
| Status | Withdrawn |
|---|---|
| Pages | 20 |
| Publication Date | 1988-12-15 |
| Withdrawn Date | 2012-04-25 |
| ISBN | 0 580 34593 9 |
| Standard Number | BS QC 750112:1988, IEC 60747-8-1:1987 |
| Title | Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Semiconductor devices. Discrete devices. Field-effect transistors. Blank detail specification for single-gate field-effect transistors, up to 5 W and 1 GHz |
| Identical National Standard Of | QC 750112, IEC 60747-8-1:1987 |
| Descriptors | Approval testing, Unijunction transistors, Qualification approval, Field-effect transistors, Electrical testing, Transistors, Quality assurance systems, Electronic equipment and components, Assessed quality, Detail specification, Semiconductor devices, Inspection, Testing conditions, Performance, Circuits, Test equipment |
| Publisher | BSI |
| Committee | EPL/47 |
| ICS Codes | 31.080.30 - Transistors |
