BSI 19/30404655 DC:2019 Edition
$13.70
BS EN IEC 63229. Semiconductor devices. The classification of defects in gallium nitride epitaxial film on silicon carbide substrate
| Published By | Publication Date | Number of Pages |
| BSI | 2019 | 23 |
| Status | Definitive |
|---|---|
| Pages | 23 |
| Publication Date | 2019-10-17 |
| Standard Number | 19/30404655 DC |
| Title | BS EN IEC 63229. Semiconductor devices. The classification of defects in gallium nitride epitaxial film on silicon carbide substrate |
| Identical National Standard Of | 47/2599/CD |
| Descriptors | Substrates (insulating), Electrical equipment, Computer hardware, Components, Electrical components, Computer components, Common terms, Electronic equipment and components, Semiconductor technology |
| Publisher | BSI |
| Committee | EPL/47 |
| ICS Codes | 31.080.01 - Semiconductor devices in general |
