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BSI 20/30380369 DC 2020

BSI 20/30380369 DC 2020

$13.70

BS ISO 23420. Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis

Published By Publication Date Number of Pages
BSI 2020 36
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This document specifies a determination procedure of energy resolution in the scanning transmission electron microscope or the transmission electron microscope equipped with the electron energy loss (EEL) spectrometer.

This document is applicable to both in-column type EEL spectrometer and post-column type EEL spectrometer. These EEL signal detecting systems are applicable to a parallel detecting system and a serial detecting system.

BSI 20/30380369 DC 2020
$13.70