šŸ”„šŸ”„ Donā€™t Miss Out on Our End of Autumn Sale. If you have any questions, feel free to click the bottom right corner to contact our customer service..

Concat us[email protected]
Shopping Cart

No products in the cart.

šŸ”
BSI 20/30406230 DC 2020

BSI 20/30406230 DC 2020

$13.70

BS IEC 63275-1. Semiconductor devices. Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors – Part 1. Test method for bias temperature instability

Published By Publication Date Number of Pages
BSI 2020 11
PDF Format Searchable Printable Preview Now
Guaranteed Safe Checkout
Category:

If you have any questions, feel free to reach out to our online customer service team by clicking on the bottom right corner. Weā€™re here to assist you 24/7.
Email:[email protected]

Status

Definitive
Pages

11
Publication Date

2020-04-01
Standard Number

20/30406230 DC
Title

BS IEC 63275-1. Semiconductor devices. Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors – Part 1. Test method for bias temperature instability
Identical National Standard Of

47/2622/CD, prEN IEC 63275-1:2021
Descriptors

Semiconductor technology, Semiconductor devices, Semiconductors, Diode transistor logic circuits, Transistor transistor logic circuits
Publisher

BSI
Committee

EPL/47
ICS Codes 31.080 - Semiconductor devices

Related products

BSI 20/30406230 DC 2020
$13.70