Name: BSI DD ENV 50219:1996 PDF - PDF Standards Store
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BSI DD ENV 50219:1996

$167.15

Description of the reliability test structures of the European mini test chip

Published By	Publication Date	Number of Pages
BSI	1996	38

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Status	Withdrawn
Pages	38
Publication Date	1996-09-15
Withdrawn Date	2012-04-20
ISBN	0 580 26037 2
Standard Number	DD ENV 50219:1996
Title	Description of the reliability test structures of the European mini test chip
Identical National Standard Of	ENV 50219:1996
Descriptors	Computer applications, Modules, Dimensions, Digital integrated circuits, Assessed reliability, Semiconductor devices, Electronic equipment and components, Integrated circuits, Transistors, Systems analysis, Test equipment, Metal oxide semiconductors, Reliability, Failure (quality control), Microprocessor chips
Publisher	BSI
Committee	EPL/501
ICS Codes	31.200 - Integrated circuits. Microelectronics


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