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BSI DD IEC/PAS 62396-2:2007

$189.07

Process management for avionics. Atmospheric radiation effects – Guidelines for single event effects testing for avionics systems

Published By Publication Date Number of Pages
BSI 2007 24
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Provides guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the atmospheric neutrons. Also shows how the test data can be used to estimate the SEE rate of devices and boards due to the atmospheric neutrons in the atmosphere at aircraft altitudes.

BSI DD IEC/PAS 62396-2:2007
$189.07