BSI PD CEN/TS 16794-2:2015
$189.07
Public transport. Communication between contactless readers and fare media – Test plan for ISO/IEC 14443
| Published By | Publication Date | Number of Pages |
| BSI | 2015 | 50 |
This Technical Specification comes as a complement to the technical requirements expressed in CEN/TS 16794-1, Public transport – Communication between contactless readers and fare media – Part 1: Implementation requirements for ISO/IEC 14443, for ensuring contactless communication interoperability between contactless fare management system terminals and contactless fare media hosting a transport ticketing application. This test plan lists all the test conditions to be performed on a contactless reader or a contactless fare media in order to ensure that all the requirements specified in CEN/TS 16794-1 are met for the device under test. This Technical Specification is then applicable to: – any contactless fare management system terminals acting as a PCD contactless reader based on ISO/IEC 14443-series standards; – any contactless fare media acting as a PICC contactless object based on ISO/IEC 14443-series standards. This test plan applies solely to the contactless communication layers described in parts 1 to 4 of the ISO/IEC 14443 series of standards. Application-to-application exchanges executed once contactless communication has been established at RF level fall outside the scope of this test plan. However, a transport ticketing application will need to be used so as to make end-to-end transactions during tests on the RF communication layer. This test plan does not duplicate the contents of ISO/IEC 14443 series or ISO/IEC 10373 6 standards. It makes reference to the ISO/IEC 10373 6 applicable tests methods, specifies the test conditions to be used and describes the additional specific test conditions that may be run. The list of test conditions applicable to the device under test will be conditioned by the Information Conformance Statement (ICS) declaration made by the device manufacturer. For each test case, the test conditions are clearly specified in order to determine the pertinence to run or not the test case in accordance with the device capabilities or in accordance with the device manufacturer’s choice. In order to facilitate the test report issuance, a test report template is included in Annex A of the present test plan. Although the present test plan aims at becoming the primary basis for certification of contactless communication protocol between contactless reader and contactless object, it does not describe any certification or qualification processes as such processes should be defined between local or global transit industry stakeholders and not within this CEN work group.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 4 | Contents Page |
| 5 | Foreword |
| 6 | Introduction |
| 7 | 1 Scope 2 Normative references |
| 9 | 3 Terms and definitions 4 Symbols and abbreviations 5 Description of the test environment 5.1 Test bench 5.2 Tolerances applicable to ambient-environment tests 5.3 PCD or PICC test conditions |
| 10 | 5.4 Positional tolerance 5.5 Admissible tolerances on the measurements 6 PCD – Analog test plan 6.1 PCD general test conditions 6.2 Conformance of the PCD field strength 6.2.1 General 6.2.2 TC_PCD_A_MaxFS: PCD maximum field strength 6.2.2.1 Scope / purpose 6.2.2.2 Test conditions |
| 11 | 6.2.2.3 Test procedure 6.2.2.4 Test report Table 1 — Result criteria for maximum PCD field strength test 6.2.3 TC_PCD_A_ MinFS : PCD minimum field strength 6.2.3.1 Scope / purpose 6.2.3.2 Test conditions 6.2.3.3 Test procedure 6.2.3.4 Test report Table 2 — Result criteria for minimum PCD field strength test |
| 12 | 6.3 Conformance of the PCD modulation waveform 6.3.1 TC_PCD_A_TAMW: Type A modulation waveform 6.3.1.1 Scope / purpose 6.3.1.2 Test conditions 6.3.1.3 Test procedure 6.3.1.4 Test report Table 3 — Result criteria for Type A modulation waveform test 6.3.2 TC_PCD_A_TBMW: Type B modulation index and waveform 6.3.2.1 Scope / purpose 6.3.2.2 Test conditions 6.3.2.3 Test procedure |
| 13 | 6.3.2.4 Test report Table 4 — Result criteria for Type B modulation index and waveform test 6.4 Conformance of the PCD load modulation reception 6.4.1 TC_PCD_A_TALMR: Type A load modulation reception 6.4.1.1 Scope / purpose 6.4.1.2 Test conditions 6.4.1.3 Test procedure 6.4.1.4 Test report Table 5 — Result criteria for Type A load modulation reception test |
| 14 | 6.4.2 TC_PCD_A_TBLMR: Type B load modulation reception 6.4.2.1 Scope / purpose 6.4.2.2 Test conditions 6.4.2.3 Test procedure 6.4.2.4 Test report Table 6 — Result criteria for Type B load modulation reception test 6.5 Conformance of the PCD sensitivity to electromagnetic disturbance 6.5.1 General 6.5.2 TC_PCD_A_TAEI: Type A EMD immunity 6.5.2.1 Scope / purpose 6.5.2.2 Test conditions |
| 15 | 6.5.2.3 Test procedure 6.5.2.4 Test report Table 7 — Result criteria for Type A EMD immunity test 6.5.3 TC_PCD_A_TBEI: Type B EMD immunity 6.5.3.1 Scope / purpose 6.5.3.2 Test conditions 6.5.3.3 Test procedure 6.5.3.4 Test report |
| 16 | Table 8 — Result criteria for Type B EMD immunity test 6.5.4 TC_PCD_A_TAER: Type A EMD handling timing constraints 6.5.4.1 Scope / purpose 6.5.4.2 Test conditions 6.5.4.3 Test procedure 6.5.4.4 Test report Table 9 — Result criteria for Type A EMD recovery test |
| 17 | 6.5.5 TC_PCD_A_TBER: Type B EMD handling timing constraints 6.5.5.1 Scope / purpose 6.5.5.2 Test conditions 6.5.5.3 Test procedure 6.5.5.4 Test report Table 10 — Result criteria for Type B EMD recovery test 7 PICC – Analog test plan 7.1 PICC general test conditions |
| 18 | 7.2 Conformance of the PICC characteristics 7.2.1 TC_PICC_A_OFS: PICC operating field strength 7.2.1.1 Scope / purpose 7.2.1.2 Test conditions 7.2.1.2.1 General test conditions 7.2.1.2.2 Timing and waveform test conditions 7.2.1.3 Test procedure |
| 19 | 7.2.1.4 Test report Table 11 — Result criteria for PICC operating field strength test for each PCD to PICC bit rate supported by the PICC 7.2.2 TC_PICC_A_LMA: PICC transmission 7.2.2.1 Scope / purpose |
| 20 | 7.2.2.2 Test conditions 7.2.2.2.1 General test conditions 7.2.2.2.2 Timing and waveform test conditions 7.2.2.3 Test procedure 7.2.2.4 Test report Table 12 — Result criteria for PICC load modulation amplitude test 7.2.3 TC_PICC_A_Rec: PICC reception 7.2.3.1 Scope / purpose 7.2.3.2 Test conditions 7.2.3.2.1 General test conditions 7.2.3.2.2 Timing and waveform test conditions |
| 21 | 7.2.3.3 Test procedure 7.2.3.4 Test report Table 13 — Result criteria for PICC reception test for each PCD to PICC bit rate supported by the PICC 7.2.4 TC_PICC_A_LDE: PICC loading effect 7.2.4.1 Scope / purpose 7.2.4.2 Test conditions 7.2.4.3 Test procedure |
| 22 | 7.2.4.4 Test report Table 14 — Result criteria for PICC loading effect test 7.2.5 TC_PICC_A_EMD: PICC EMD level and low EMD time 7.2.5.1 Scope / purpose 7.2.5.2 Test conditions 7.2.5.2.1 General test conditions 7.2.5.2.2 Timing and waveform test conditions 7.2.5.3 Test procedure 7.2.5.4 Test report Table 15 — Result criteria for PICC EMD level and low EMD time test |
| 23 | 8 PCD – Protocol and digital test plan 8.1 PCD general test conditions 8.1.1 General 8.1.2 List of test command sequences Table 16 —Test command sequence for scenarios not needing PCD chaining Table 17 —Test command sequence for scenarios dealing with PCD chaining 8.2 PCD Digital conformance to ISO/IEC 14443- series 8.3 Conformance of the PCD characteristics 8.3.1 TC_PCD_D_TADT: PCD Type A detection time 8.3.1.1 Scope / purpose 8.3.1.2 Test procedure |
| 24 | 8.3.1.3 Test report Table 18 — Result criteria for PCD Type A detection time test 8.3.2 TC_PCD_D_TBDT: PCD Type B detection time 8.3.2.1 Scope / purpose 8.3.2.2 Test procedure 8.3.2.3 Test report |
| 25 | Table 19 — Result criteria for PCD Type B detection time test 8.3.3 TC_PCD_D_AFI: AFI value sent by the PCD 8.3.3.1 Scope / purpose 8.3.3.2 Test procedure 8.3.3.3 Test report Table 20 — Result criteria for AFI value sent by the PCD test 8.3.4 TC_PCD_D_ATQB: PCD extended ATQB option 8.3.4.1 Scope / purpose 8.3.4.2 Test procedure |
| 26 | 8.3.5 Test report Table 21 — Result criteria for PCD extended ATQB option test 8.3.6 TC_PCD_D_RFU: Recommendations on RFU bits and values reception test 8.3.6.1 Scope / purpose |
| 27 | 8.3.6.2 Test procedures 8.3.6.3 Test report |
| 28 | Table 22 — Result criteria for recommendations on RFU bits and values reception test 8.3.7 TC_PCD_D_PRO: Proprietary protocols management by the PCD 8.3.7.1 Scope / purpose 8.3.7.2 Test procedure 8.3.7.3 Test report 9 PICC – Protocol and digital test plan 9.1 PICC general test conditions 9.2 PICC Digital conformance to ISO/IEC 14443- series 9.3 Conformance of the PICC characteristics 9.3.1 TC_PICC_D_ATQB: PICC support of REQB/WUPB allowing extended ATQB 9.3.1.1 Scope / purpose |
| 29 | 9.3.1.2 Test procedure 9.3.1.3 Test report Table 23 — PICC support of REQB/WUPB allowing extended ATQB 9.3.2 TC_PICC_D_RFU: Recommendations on RFU bits and values reception test 9.3.2.1 Scope / purpose |
| 30 | 9.3.2.2 Test procedures |
| 31 | 9.3.2.3 Test report Table 24 — Result criteria for recommendations on RFU bits and values reception test 9.3.3 TC_PICC_D_TL: PICC type locking 9.3.3.1 Scope / purpose 9.3.3.2 Test procedure |
| 32 | 9.3.3.3 Test report Table 25 — Result criteria for PICC supported frame size in receiver mode test 9.3.4 TC_PICC_D_RAMP: field ramp-ups and shut-offs 9.3.4.1 Scope / purpose 9.3.4.2 Test procedure 9.3.4.3 Test report Table 26 — Result criteria for PICC concerning field ramp-ups and shut-offs |
| 33 | Annex A (informative) Test report templates A.1 PCD – Test results summary |
| 35 | A.2 PCD – Analog test results (detailed) |
| 42 | A.3 PCD – Protocol and digital test results (detailed) |
| 43 | A.4 PICC – Test results summary |
| 44 | A.5 PICC – Analog test results (detailed) |
| 47 | A.6 PICC – Protocol and digital test results (detailed) |
