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BSI PD IEC TS 62804-2:2022

BSI PD IEC TS 62804-2:2022

$189.07

Photovoltaic (PV) modules. Test methods for the detection of potential-induced degradation – Thin-film

Published By Publication Date Number of Pages
BSI 2022 48
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PDF Catalog

PDF Pages PDF Title
2 undefined
4 CONTENTS
6 FOREWORD
8 INTRODUCTION
11 1 Scope
2 Normative references
12 3 Terms and definitions
4 Samples
13 5 Tests
5.1 General
14 5.2 Test procedures – Outdoor measurements
5.2.1 General
5.2.2 Apparatus
Tables
Table 1 – General schema of test procedures
16 Figures
Figure 1 – Circuit suitable for electrical loading, application of system voltage bias and evaluation of leakage current from the module on the ground return-side
17 5.2.3 Optional monitoring
Figure 2 – Module mounting configuration for isolation and measurement of current transfer to ground
Figure 3 – Circuit suitable for electrical loading, application of system voltage bias and evaluation of leakage current from the module
18 5.2.4 Test conditions
5.2.5 Procedure
19 Figure 4 – Test flow for performing PID tests in the field associated with procedures described in 5.2.2 to 5.2.5 for evaluation of coulombic transfer from the cell circuit of the module to earth
21 5.2.6 Acceleration by elevated system voltage testing outdoors
23 5.3 Test procedures – Accelerated testing in environmental chamber
5.3.1 General
24 5.3.2 Test of modules in the dark and unpowered state
25 Figure 5 – PID test flow for performing voltage stress test with module dark and unpowered
27 Figure 6 – Apparatus for applying system voltage bias (Vsys) to a PV module in an environmental chamber
29 Figure 7 – Example test time-temperature-humidity-voltage profile for application of stress in an environmental chamber
31 5.3.3 Testing in chamber with light bias or current
32 Figure 8 – Schematic for isolated power supply for application of forward bias voltage (Vfwd)
33 Figure 9 – Schematic for application of system voltage (Vsys) bias on test module on normally grounded parts
34 Figure 10 – Apparatus for applying system voltage bias (Vsys) to a PV module in an environmental chamber under light bias
35 Figure 11 – PID test flow for modules placed under voltage stress and with light bias or dark forward bias voltage
38 5.3.4 Acceleration factor determination—coulomb basis
39 6 Test report
40 Table 2 – PID chamber test report table (example) (Variables are given in 5.3.2.3.3.7 and 5.3.4.1)
Table 3 – PID chamber recovery test report table (example) (Variables are given in 5.3.3.4)
42 Annex A (normative)Evaluation for moisture ingress sensitivity
A.1 General
A.2 Procedure
43 A.3 Evaluation
Figure A.1 – Test flow for modules to detect and evaluate moisture ingress on PID rate
45 Annex B (informative)Dew point and required chamber relative humidity (RH) setpoints depending on temperature difference between module and the chamber air
Table B.1 – Dew point and required chamber relative humidity (RH) setpoints depending on temperature difference between module and the chamber air
46 Bibliography

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BSI PD IEC TS 62804-2:2022
$189.07