BSI PD ISO/TR 14187:2011
$189.07
Surface chemical analysis. Characterization of nanostructured materials
| Published By | Publication Date | Number of Pages |
| BSI | 2011 | 50 |
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 9 | 1 Scope 2 Terms and definitions 3 Symbols and abbreviated terms |
| 11 | 4 Characterization of nanostructured materials with surface analysis methods 4.1 Introduction |
| 14 | 4.2 Electron Spectroscopies (AES and XPS) |
| 20 | 4.3 Ion-beam surface analysis methods (SIMS and LEIS) 4.3.1 SIMS and examples of SIMS applications – During SIMS measurements (Figure 1), primary ion beams of Ga+, Ar+, O2+, Cs+, C60+, Au+, Bi+ or other atomic, molecular or cluster ions with energies between 3 and 20 keV are incident on the surface and the ions removed (sputtered) from the surface are detected. To extract surface molecular information, SIMS is used in a “static” mode that involves a low density and low total dose of ions such that the surface damage and alteration is minimized. Both atomic and molecular secondary ions are used to extract the surface information [84]. |
| 21 | 4.3.2 Low energy ion scattering and applications to nanomaterials |
| 22 | 4.4 Scanning probe microscopy |
| 23 | 4.5 Surface characterization of carbon nanostructures 5 Analysis considerations, issues and challenges associated with characterization of nanostructured materials: Information for the analyst. 5.1 Introduction |
| 24 | 5.2 General considerations and analysis challenges |
| 25 | 5.3 Physical properties |
| 26 | 5.4 Particle stability and damage: influence of size, surface energy and confluence of energy scales 5.4.1 Crystal structure |
| 27 | 5.4.2 Damage and probe effects 5.4.3 Time and environment 5.4.3.1 General information |
| 29 | 5.4.3.2 Effect of environment on nanomaterial structure and properties 5.4.3.3 Time-dependent properties |
| 30 | 5.4.3.4 Proximity effects |
| 31 | 5.5 Sample mounting and preparation considerations |
| 32 | 5.6 Specific considerations for analysis of nanostructured materials using XPS, AES, SIMS and SPM 5.6.1 Introduction 5.6.2 Issues related to application of XPS to nanomaterials 5.6.2.1 General information |
| 33 | 5.6.2.2 Influence of shape |
| 34 | 5.6.2.3 Low density of particles supported on a substrate |
| 35 | 5.6.2.4 Agglomerates of particles 5.6.2.5 Binding-energy and peak-width changes 5.6.3 Issues related to the application of AES to nanostructured materials 5.6.4 Issues related to application of SIMS to nanoparticles |
| 37 | 5.6.5 Issues related to the application of scanning probe methods to nanoparticles 6 General characterization needs and opportunities for nanostructured materials |
