IEC 60333:1993
$56.55
Nuclear instrumentation – Semiconductor charged-particle detectors – Test procedures
| Published By | Publication Date | Number of Pages |
| IEC | 1993-07-14 | 79 |
Applies to semiconductor radiation detectors which are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described have been selected to be readily available to all manufacturers and users of semiconductor charged-particle detectors.
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