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IEC 60747-18-1:2019

IEC 60747-18-1:2019

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Semiconductor devices – Part 18-1: Semiconductor bio sensors – Test method and data analysis for calibration of lens-free CMOS photonic array sensors

Published By Publication Date Number of Pages
IEC 2019-05-20 30
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IEC 60747-18-1:2019 (E) specifies the test methods and data analysis for the calibration of lens-free CMOS photonic array sensors. This document includes the test conditions of each process, configuration of lens-free CMOS photonic array sensors, statistical analysis of test data, calibration for planarization and linearity, and test reports.

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IEC 60747-18-1:2019
$50.05