IEC 60749-12:2017
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Semiconductor devices – Mechanical and climatic test methods – Part 12: Vibration, variable frequency
| Published By | Publication Date | Number of Pages |
| IEC | 2017-12-13 | 18 |
IEC 60749-12:2017 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages
This second edition cancels and replaces the first edition published in 2002. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition:
a) alignment with MIL-STD-883J Method 2007, Vibration, variable frequency.
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