IEC 60749-16:2003
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Dispositifs à semiconducteurs – Méthodes d’essais mécaniques et climatiques – Partie 16 : détection de bruit d’impact de particules (PIND)
Published By | Publication Date | Number of Pages |
IEC | 2003-01-17 | 22 |
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Published Code | IEC |
---|---|
Published By | International Electrotechnical Commission |
Publication Date | 2003-01-17 |
Pages Count | 22 |
Language | France |
Edition | 1.0 |
File Size | 215.0 KB |
ICS Codes | 31.080.01 - Semiconductor devices in general |
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