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IEC 60759:1983

$63.70

Standard test procedures for semiconductor X-ray energy spectrometers

Published By Publication Date Number of Pages
IEC 1983-01-01 102
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Gives standard test procedures for semiconductor X-ray energy spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer.

IEC 60759:1983
$63.70