IEC 61445:2012
$74.75
Digital Test Interchange Format (DTIF)
| Published By | Publication Date | Number of Pages |
| IEC | 2012-06-21 | 112 |
IEC 61445:2012(E) defines the information content and the data formats for the interchange of digital test program data between DATPGs and automatic test equipment (ATE) for board-level printed circuit assemblies. This information can be broadly grouped into data that defines the following:
a) UUT Model;
b) Stimulus and Response;
c) Fault Dictionary;
d) Probe.
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